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Critical Current Density of Narrow Superconducting Thin Films Fabricated by Laser Ablation Techniques

Published online by Cambridge University Press:  28 February 2011

L. W. Song ,
Y. H. Kao ,
Q. Y. Ying ,
J. P. Zheng ,
H. S. Kwok ,
Y. Z. Zhu  and
D. T. Shaw
L. W. Song
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
Y. H. Kao
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
Q. Y. Ying
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
J. P. Zheng
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
H. S. Kwok
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
Y. Z. Zhu
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
D. T. Shaw
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, New York 14260
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Abstract

The variations of critical current density Jc of narrow Y‐Ba‐Cu‐O films as a function of temperature and magnetic field are investigated. Films with thickness of 150‐200 nm and width of 20‐100 urn were prepared by laser ablation and laser etching. For t (=T/TC) < 0.75, the temperature dependence of Jc shows a (1‐1) linear behavior, in sharp contrast to that of a Josephson junction. Near Tc, Jc varies with (1‐ t)n where n=3/2 or 2 depending on the morphology of films. The magnetic field dependence of Jc above a characteristic field value Hc’ can be described by a model based on flux creep.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 891
Copyright
Copyright © Materials Research Society 1990

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References

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