A variety of surface sensitive techniques has been used to assess surface layers formed on SRL 165 waste glass specimens from the Stripa burial study and from a laboratory study designed to simulate conditions of the Stripa environment. The laboratory study included static and slow flow tests carried out for periods up to 6 and 24 months, respectively. Comparisons of leached layers formed in the two studies are based upon secondary ion mass spectrometry (SIMS), Fourier transform infrared reflection spectroscopy (FTIRRS), and scanning electron microscopy-electron microprobe (SEM-EMP) analysis.
Results demonstrate that surface layers having similar trends in elemental profiles were developed in both lab and field tests. It was also found that both sets of samples showed similar changes in FTIRR spectra. One significant difference between the lab and field samples was that surface alteration, as indicated by changes in FTIRR spectra and leached layer thickness (from SIMS), occurred more rapidly in the lab tests.