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Convergent-Beam Diffraction in the Characterization of Crystalline Phases

  • J. A. Eades (a1), M. J. Kaufman (a1) and H. L. Fraser (a1)

Abstract

Convergent-beam diffraction in the transmission electron microscope is a powerful technique for the characterization of crystalline materials. Examples are presented to show the way in which convergent-beam zone-axis patterns can be used to determine: the unit cell; the symmetry; the strain of a crystal. The patterns are also recognizable and so can be used, like fingerprints, to identify phases.

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1. Tanaka, M. and Terauchi, M., Convergent-Beam Electron Diffraction (JEOL, Tokyo, 1985) 192p;
Steeds, J. W., “Convergent Beam Electron Diffraction” in Introduction to Analytical Electron Microscopy, Hren, J. J., Goldstein, J. I. and Joy, D. C., eds., Plenum 1979, pp. 387422;
Steeds, J. W., “Electron Crystallography,” in Quantitative Electron Microscopy, Chapman, J. N. and Craven, A. J., eds., Scottish Universities Summer School in Physics 1984, pp. 4996;
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