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A Comparative Study of Residual Stresses in Single and Multilayer Composite Diamond Coatings

Published online by Cambridge University Press:  10 February 2011

K. Jagannadham  and
T. R. Watkins
K. Jagannadham
Affiliation:
Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695–7916, Jag@mat.mte.ncsu.edu
T. R. Watkins
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
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Abstract

Residual stresses in four types of diamond films deposited by hot filament chemical vapor deposition on molybdenum substrate, three types on tungsten carbide or silicon nitride substrate are measured. Residual stresses are determined by X-ray method and Raman spectroscopy. The results from both these techniques are compared and conclusions are made on the mechanisms of adhesion of diamond films to the different substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 505 , 1997 , 391
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

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