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Chemistry and Structure of Internal Interfaces in Inorganic Materials

Published online by Cambridge University Press:  15 February 2011

M. Rühle
Affiliation:
Max-PIanck-Institut für Metallforschung, Seestr. 92, D-70174 Stuttgart, Germany
A. Recnik
Affiliation:
J. Stefan Institute, University of Ljubljana, Jamova 39, 1001 Ljubljana, Slovenia
M. Ceh
Affiliation:
J. Stefan Institute, University of Ljubljana, Jamova 39, 1001 Ljubljana, Slovenia
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Abstract

Physical properties of polycrystalline materials are controlled by intergranular as well as intragranular effects. In most cases materials' properties adhere to the bonding character of internal interfaces and plasticity of bulk parts. The nature of interfaces is in general difficult to understand, although they have far reaching consequences to overall properties of processed materials. To properly understand the effects brought by such interfaces one has to correlate particular properties with their local chemistry and structure. The availability of modern instrumentation that can provide a detailed chemical and structural information down to a subnanometer scale has helped greatly in tackling many fundamental problems in materials science. Our systematic studies of several metal/ceramic and ceramic/ceramic interfaces has given us a wealth of information that brings us closer to the answer on the formation mechanisms of the internal interfaces and other structural transformations in materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. Sutton, A.P. and Balluffi, R.W.. Interfaces in Crystalline Materi-als. Clarendon Press, Oxford (1995).Google Scholar
2. Interfacial Segregation, edited by Johnson, W.C. and Blakely, J.M. (American Society for Metals, Metals Park, Ohio, 1978).Google Scholar
3. Maier, J., J. Electrochem. Soc. 134, 1524 (1987).Google Scholar
4. Majid, I., Bristowe, P.D. and Balluffi, R.W., Phys. Rev. B40, 27792792 (1989).Google Scholar
5. Cowley, J.M., Diffraction Phvsics. 3rd ed. (North Holland, Amsterdam, 1995)Google Scholar
6. High-Voltage and High-Resolution Electron Microscopy, edited by Rühle, M., Phillipp, F., Seeger, A., Heydenreich, J., Ultramicroscopy 56, 1232 (1994).Google Scholar
7. Proceedings of the Second International Workshop on Electron Energy Loss Spectroscopv and Imaging (EELSI). edited by Krivanek, O.L., Microsc. Microanal. Microstruct. 6, 1157 (1995).Google Scholar
8. French-Japanese Seminar on In Situ Electron Microscopy, edited by Louchet, F., Saka, H., Microsc. Microanal. Microstruct. 4, 101346 (1993).Google Scholar
9. Pennycook, S.J., Jesson, D.E., Ultramicroscopy 37, 1438 (1991).Google Scholar
10. Hirsch, P., Howie, A., Nicholson, R., Pashley, D.W., Whelan, M.J., Electron Microscopy of Thin Crystals (Butterworths, London 1965).Google Scholar
11. Butler, E.P., Hale, K.F., Dynamic Experiments in Electron Microscopy (North Holland. Amsterdam, 1981)Google Scholar
12. Lake Tahoe Workshop on Electron Energy Loss Spectroscopv. edited by Kxivanek, O.L., Microsc. Microanal. Microstruct. 2, 143411 (1990).Google Scholar
13. Loretto, M.H., Electron Beam Analysis of Materials. Chapman and Hall, London (1984).Google Scholar
14. Deininger, C., Mayer, J., Rühle, M., Optik 99, 135140 (1995).Google Scholar
15. Kleebe, H.J., Bruley, J., Rühle, M., J. of the European Ceramic Society 14, 111 (1994).Google Scholar
16. Browning, N.D., Chisholm, M.F., Pennycook, S.J., Nature 366 143146 (1993).Google Scholar
17. Gatts, C., Duscher, G., Müllejans, H. and Rühle, M., Ultramicroscopy 59, 229239 1995).Google Scholar
18. Müllejans, H. in Proc. 1st Slowenian- German Seminar on Joint Projects in Materials Science and Technology, edited by Kolar, D., Suvorov, D. (Jülich GmbH, Jülich 1995) 914.Google Scholar
19. Brydson, R., Bruley, J., Müllejans, H., Scheu, C., Rühle, M., Ultramicroscopy 59, 8192 (1995).Google Scholar
20. Brydson, R., Sauer, H., Engel, W., in Transmission Electron Energy Loss Spectrometrv in Materials Science, edited by Disko, M. M., Ahn, C. C., Fultz, B. (TMS Monograph Series, Warrendale, USA 1992) 131154.Google Scholar
21. Bihr, J., Benner, G., Krahl, D., Rilk, A., Weimer, E., in Proc. 49th Ann. Meeting EMSA. edited by Bailey, G.W., (San Francisco Press. San Francisco 1991) 354355.Google Scholar
22. Mayer, J., Szabo, D.V., Rühle, M., Seher, M., Riedel, R., J. Eur. Cer. Soc. 15, 717727 (1995).Google Scholar
23. Krivanek, O.L., Mory, C., Tence, M., Colliex, C., Microsc. Microanal. Microstruct. 2, 257267(1991).Google Scholar
24. Berger, A., Mayer, J., Kohl, H., Ultramicroscopy 55, 101112 (1994).Google Scholar
25. Jäger, W., Mayer, J., Ultramicroscopy 59, 3345 (1995).Google Scholar
26. Möbus, G. and Rühle, M.. Ultramicroscopy 56. 5470 (1994).Google Scholar
27. Möbus, G. and Dehm, G., Ultramicroscopy 60, 205 (1996).Google Scholar
28. Ernst, F., Finnis, M.W., Koch, A., Schmidt, C., Straumal, B., Gust, W., Z. Metallkde 87, 911 (1996).Google Scholar
29. Joining of Ceramics, edited by Nicholas, M.G. (Chapman and Hall, London 1990).Google Scholar
30. Dehm, G., Rühle, M., Ding, G. and Raj, R., Phil. Mag. B 71, 11111124 (1995).Google Scholar
31. Dehm, G., Ernst, F., Mayer, J., Möbus, G., Müllejans, H., Phillipp, F., Scheu, C. and Rühle, M., Z. Metallkde 87, 898910 (1996).Google Scholar
32. Ceh, M., Gu, H., Müllejans, H., Recnik, A.. to be published.Google Scholar
33. Elcombe, M.M., Kisi, E.H., Hawkins, K.D., White, T.J., Goodman, P. and Matheson, S., Acta Cryst. B47, 305 (1991).Google Scholar
34. Ceh, M., Krasevec, V. and Kolar, D., Solid, J. State Chem. 103, 263 (1993).Google Scholar