Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-22T23:28:17.445Z Has data issue: false hasContentIssue false

Chemical Ordering and Microstructure of FePd Thin Films with perpendicular Magnetic Anisotropy

Published online by Cambridge University Press:  14 March 2011

Gilles B.
Affiliation:
LTPCM-ENSEEG, BP 75, 38402 St Martin d'Hères, France
Halley D.
Affiliation:
DRFMC/SP2M/NM, CEA Grenoble Cedex 9, 38054, France
Marty A.
Affiliation:
DRFMC/SP2M/NM, CEA Grenoble Cedex 9, 38054, France
Samson Y.
Affiliation:
DRFMC/SP2M/NM, CEA Grenoble Cedex 9, 38054, France
Patrat G.
Affiliation:
Laboratoire de Cristallographie du CNRS, BP 166, 38042 Grenoble Cedex 9, France
Get access

Abstract

FePd(001) thin films have been grown by the molecular beam epitaxy (MBE) technique. At room temperature, these films are chemically disordered whereas at 350 °C a well ordered L10 structure is found with the c-axis oriented in the growth direction. By combining RHEED, STM and Auger measurements, it is suggested that ordering occurs at the growing surface by the development of bi-atomic steps of the ordered structure. We have put in evidence that the surfactant behavior of the Pd atoms is mainly involved in the ordering process and selects the single orientation of the c-axis. For intermediate temperatures between RT and 350 °C, TEM and X-rays have evidenced a pseudo-periodic arrangement of anti-phased domains having a columnar shape. The variation of the long-range order parameter is related to the average size of these ordered domains.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Weller, D., Moser, A., Folks, L., Best, M.E., Lee, W., Toney, M.F., Thiele, J. and Doerner, M.F., TMRC'99, San Diego, Aug. 1999 (To be published in IEE Trans. Magn.).Google Scholar
2. Gehanno, V., Marty, A., Gilles, B. and Samson, Y., Phys. Rev., B55, 12552 (1997).10.1103/PhysRevB.55.12552Google Scholar
3. Samson, Y., Marty, A., Hoffmann, R., Gehanno, V. and Gilles, B., Journal of Applied Physics, 85, 4604 (1999).10.1063/1.370422Google Scholar
4. Hoffmann, R., Samson, Y., Marty, A., Gehanno, V., Gilles, B. and Mazille, JE., Journal of Magnetism and Magnetic Materials, 192, 409 (1999).10.1016/S0304-8853(98)01075-0Google Scholar
5. Sato, H. and Toth, R.S., Phys. Rev., 124, 1833 (1961).10.1103/PhysRev.124.1833Google Scholar
6. Kawabata, T., Kanai, T. and Izumi, O., Acta metall., 33, 1355 (1985).10.1016/0001-6160(85)90245-7Google Scholar
7. Warren, B.E., X-Ray Diffraction, ed. Addison-Wesley, (Reading, 1969).Google Scholar
8. Brown, S.J., Grimshaw, M.P., Ritchie, D.A. and Jones, G.A.C., Appl. Phys. Lett., 69, 1468 (1996).10.1063/1.116910Google Scholar
9. Bourgognon, C., Tatarenko, S., Cibert, J., Carbonell, L., Etgens, V., Edrief, M., Gilles, B., Marty, A. and Samson, Y., Appl. Phys. Lett., 76, 1455 (2000).10.1063/1.126062Google Scholar
10. Farrow, R.F.C., Weller, D., Marks, R.F., Toney, M.F., Horn, S., Harp, G.R. and Cebollada, A., Appl. Phys. Lett., 69, 166 (1996).Google Scholar
11. Halley, D., Samson, Y., Marty, A., Beigne, C. and Gilles, B. (submitted to Phys. Rev. B).Google Scholar
12. Barbier, L., Salanon, B. and Loiseau, A., Phys. Rev. B, 50, 4929 (1994).10.1103/PhysRevB.50.4929Google Scholar
13. Goapper, S., Barbier, L., Salanon, B., Loiseau, A. and Torelles, X., Phys. Rev. B, 57, 12497 (1998).10.1103/PhysRevB.57.12497Google Scholar
14. Seah, M.P., Practical Surface Analysis, ed. Briggs, D. and Seah, M.P. (J. Wiley & Sons, 1988) pp.181216.Google Scholar
15. Bertolini, J.C., Rousset, J.L., Miegge, P., Massardier, J., tardy, B., Samson, Y., Khanra, B.C. and Creemers, C., Surf. Sci., 281, 102 (1993).10.1016/0039-6028(93)90859-IGoogle Scholar
16. Cheong, B. and Laughlin, D.E., Scripta Metall. et Mater., 29, 829 (1993).10.1016/0956-716X(93)90235-KGoogle Scholar