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Characterizing Trace Metal Impurities in Optical Waveguide Materials Using X-Ray Absorption

Published online by Cambridge University Press:  10 February 2011

P. H. Citrin ,
P. A. Northrup ,
R. M. Atkins ,
P. F. Glodis ,
L. Niu ,
M. A. Marcus  and
D. C. Jacobson
P. H. Citrin
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. A. Northrup
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
R. M. Atkins
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. F. Glodis
Affiliation:
Bell Laboratories, Lucent Technologies, Norcross, GA 30071
L. Niu
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
M. A. Marcus
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
D. C. Jacobson
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
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Abstract

X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 251
Copyright
Copyright © Materials Research Society 1998

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References

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