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The Characterization of Thin Films and Layered Structures Using X-RAY Absorption and Reflection at Grazing Incidence

Published online by Cambridge University Press:  26 February 2011

S. M. Heald ,
J. M. Tranquada ,
D. O. Welch  and
H. Chen
S. M. Heald
Affiliation:
Metallurgy and Materials Science Division Brookhaven National Laboratory, Upton, New York 11973
J. M. Tranquada
Affiliation:
Metallurgy and Materials Science Division Brookhaven National Laboratory, Upton, New York 11973
D. O. Welch
Affiliation:
Metallurgy and Materials Science Division Brookhaven National Laboratory, Upton, New York 11973
H. Chen
Affiliation:
Metallurgy and Materials Science Division Brookhaven National Laboratory, Upton, New York 11973
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Abstract

X-rays at grazing incidence have a short, controllable penetration depth and are well suited as a probe of surface and interface structures. This paper examines the possibility applying grazing-incidence reflectivity and Extended X-Ray Absorption Fine Structure (EXAFS) measurements to such systems. Results are presented for an Al-Cu couple for which both high resolution reflectivity and interface EXAFS measurements are made. The latter results are the first interface specific EXAFS data to be reported. Distinct changes in both signals are observed upon annealing, demonstrating the potential of the techniques.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 37: Symposium D – Layered Structures, Epitaxy, and Interfaces , 1984 , 437
Copyright
Copyright © Materials Research Society 1985

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References

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