Skip to main content Accessibility help
×
Home

Characterization of Thermally Evaporated Ag-Ge-S Thin Films

  • Fei Wang (a1), William Porter Dunn (a2), Mukul Jain (a3), Carter De Leo (a4), Nicholas Vicker (a5), Richard Savage (a6), Xiaomin Jin (a7), Sergey Mamedov (a8) and Punit Boolchand (a9)...

Abstract

Thin films of ternary (GeS3)1−xAgx glasses (x=0.1 and 0.2) are studied in this work. Thin films are fabricated in a vacuum thermal evaporator at 3 different evaporation angles (0°, 30° and 45°). All thin film samples are examined in Raman spectroscopy. Raman results of both normally and obliquely deposited thin film samples reveal Ge-S CS modes (∼340cm−1) , Ge-S ES (∼360cm−1) modes, and thiogermanate modes Q1∼Q3 (390cm−1∼437cm−1). In addition, sharp peaks due to sulfur rings (S8) are observed at 218cm−1 and 470cm−1. Raman line-shapes of thin films are qualitatively consistent with their corresponding bulk glasses. However, the sharp peaks due to sulfur rings were not observed in bulk glasses. By comparing CS modes of thin films of three angles, we observe that normally deposited (0 degree) thin film shows a red-shift in center and a broadening in width. The film thickness of normally deposited films are significantly smaller comparing with that of corresponding obliquely deposited films.

Copyright

References

Hide All
1. Ovshingsky, S. R. Phys. Rev. Lett. 21, 1450 (1968)
2. Ohta, T. J. Optoelectron. Adv. Later. 3, 609 (2001)
3. Siegel, J. Schropp, A. Solis, J. Afonso, C.N. Wuttig, M. Appl. Phys. Lett. 84, 2250 (2004)
4. Ohta, T. Ovshynsky, E.R. in Photo-Induced Metastavility in Amorphous Semiconductors, edited by Kovobov, A.V. Wiley-VCH, Weinheim, p. 310 (2003)
5. Kozicki, M.N. Yun, M. Yang, S. J. Aberouette, J.P, Bird, J.P. Superlattices and Microstructures, 27, No. 5/6 (2000)
6. Kozicki, M. N. Gopalan, C. Balakrishnan, M. Park, M. Mitkova, M. Non-Volatile Memory Technology Symposium Proceedings 15-17 (2004)
7. Chaitanya, I. et al. presentation at American Physical Society March Meeting, Baltimore, MD, 2006 (unpublished)
8. Leo, Carter De, Senior Project Report, California Polytechnic State University (2007)
9. Sakamoto, et al. Appl. Phys. Lett. 82 (2003)
10. Boolchand, P. Wang, Fei and Vempati, Uday, presentation at American Physical Society March Meeting, Montreal, Canada 2004 (unpublished)
11. Wang, Fei, Mitkova, M. Boolchand, P. presentation at 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Denver, Colorado 2007 (unpublished)
12. Wang, Fei, PhD Thesis, University of Cincinnati (2005)
13. Wang, Y. Mitkova, M. Georgiev, D.G. Mamedov, S. Boolchand, P. J. Phys: Condensed Matter, 15, S1573 (2003)
14. Mitkova, M. Wang, Y. Boolchand, P. Phys. Rev. Lett. 83, 3848 (1999)
15. Gu, M. X. et al. J. of Raman Spectrosc. 38, 780788 (2007)
16. Stabl, M. Ticky, L. Solid State Science, 7, 201207 (2005)

Keywords

Characterization of Thermally Evaporated Ag-Ge-S Thin Films

  • Fei Wang (a1), William Porter Dunn (a2), Mukul Jain (a3), Carter De Leo (a4), Nicholas Vicker (a5), Richard Savage (a6), Xiaomin Jin (a7), Sergey Mamedov (a8) and Punit Boolchand (a9)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed