Skip to main content Accessibility help
×
Home

Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction

  • B. Wessler (a1), A. Steinecker (a2) and W. Mader (a2)

Abstract

Epitaxial thin films of rare-earth hexaaluminates on basal plane sapphire have been produced by chemical solution deposition. LaAl11O18 films with magnetoplumbite structure grow with (0001)HA||(0001)S and [1100]HA||[2110]s orientation relationship

To investigate the stucture of the interface exit wave reconstruction of focus series was carried out using a field emission TEM. Due to the inversion of the imaging process major artefacts at the interface can be eliminated. Exit waves were simulated based on different interface models and were compared with the reconstructed waves to localize the positions of the atoms at the interface. Two different types of interfaces were observed in the samples. One of the types, in which the spinel block of hexaaluminate faces the sapphire with the mixed cation layer with occupied octahedra and tetrahedra, is characterized in detail. Face-sharing of coordination polyhedra is avoided to large extent

Copyright

References

Hide All
1. Kahn, A., Lejus, A. M., Madsac, M., Thëry, J., Vivien, D., J. Appl. Phys. 52, 6864 (1981)10.1063/1.328680
2. Verstegen, J. M. P. J., Stevels, A. L. N., J. Lumin. 9, 406 (1974)10.1016/0022-2313(74)90033-7
3. Machida, M., Sato, A., Murakani, M., Kijima, T., Arai, H., J. Catalysis 157, 713 (1995)10.1006/jcat.1995.1337
4. Vaidya, K. J., Yang, C. Y., DeGraef, M., Lange, F. F., J. Mater. Res. 9 (2), 410 (1994)10.1557/JMR.1994.0410
5. Cinibulk, M. K., J. Mater. Res. 14 (9), 3581 (1999)10.1557/JMR.1999.0484
6. Iyi, N., Tekenawa, S., Kimura, S., J. Solid State Chem. 54, 70 (1984)10.1016/0022-4596(84)90132-4
7. Stadelmann, P. A., Ultramicroscopy 21, 131 (1987)10.1016/0304-3991(87)90080-5
8. Thust, A., Coene, W.M.J., Beeck, M. Op de, Dyck, D. Van, Ultramicroscopy 64, 211 (1996)10.1016/0304-3991(96)00011-3
9. Iyi, N., Tekenawa, S., Kimura, S., J. Solid State Chem. 83, 8 (1989)10.1016/0022-4596(89)90048-0
10. Lutterotti, L., Scardi, P., J. Appl. Cryst. 23, 246 (1990)10.1107/S0021889890002382
11. Kilaas, R., CrystalKit, Version 1.8.2., Berkeley, USA

Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction

  • B. Wessler (a1), A. Steinecker (a2) and W. Mader (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed