Hostname: page-component-5c6d5d7d68-xq9c7 Total loading time: 0 Render date: 2024-08-22T23:11:47.637Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Surface Morphology in Epitaxial Growth

Published online by Cambridge University Press:  21 February 2011

Jacques G. Amar  and
Fereydoon Family
Jacques G. Amar
Affiliation:
Department of Physics, Emory University, Atlanta GA 30322
Fereydoon Family
Affiliation:
Department of Physics, Emory University, Atlanta GA 30322
Get access

Abstract

Simulated kinematic antiphase RHEED and HRLEED profiles are calculated for a model of Fe/Fe(100) deposition in order to clarify the interpretation of diffraction profiles in recent experiments on Fe/Fe(100) growth. Similar calculations are also presented for a self-affine surface. While self-affine surfaces do not exhibit a characteristic RHEED peak, in the case of surfaces with a typical length scale, the simulated RHEED profile exhibits a peak corresponding to the typical feature size, in agreement with recent experiments. The existence of this peak appears to be due to the large amount of shadowing present in low-angle RHEED which limits the amount of destructive interference between layers. In contrast, simulated HRLEED profiles exhibit an invariant profile for both self-affine and mound-like surface morphologies. The disappearance of the peak in HRLEED for surfaces which have large mound structures is explained in terms of the antiphase condition and the range of variation of terrace sizes and provides an alternative explanation for the HRLEED results observed in the experiment of Ref. 9.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 399: Symposium D – Evolution of Epitaxial Structure and Morphology , 1995 , 95
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Family, F. and Vicsek, T., Dynamics of Fractal Surfaces, (World Scientific, Singapore 1992).Google Scholar
2 Ehrlich, G. and Hudda, F., J. Chem. Phys. 44, 1039 (1966); R.L. Schwoebel, J. Appl. Phys. 40, 614 (1969)Google Scholar
3 Edwards, S.F. and Wilkinson, D.R., Proc. R. Soc. Lond. A381, 17 (1982).Google Scholar
4 Villain, J., J. Phys. I (France) 1, 19 (1991).Google Scholar
5 Smith, G.W., Pidduck, A.J., Whitehouse, C.R., Glasper, J.L., and Spowart, J., J. Cryst. Growth 127, 966 (1993).Google Scholar
6 Johnson, M.D., Orme, C., Hunt, A.W., Graff, D., Sudijono, J., Sander, L.M., and Orr, B.G., Phys. Rev. Lett. 72 116 (1994).Google Scholar
7 Ernst, H.-J., Fabre, F., Folkerts, R., and Lapujoulade, J., Phys. Rev. Lett. 72, 112 (1994).Google Scholar
8 Van Nostrand, J.E., Jay Chey, S., Hasan, M.-A., Cahill, D.G., and Greene, J.E., Phys. Rev. Lett. 74, 1127 (1995).Google Scholar
9 He, Y.L., Yang, H.N., Lu, T.M., and Wang, G.C., Phys. Rev. Lett. 69, 3770 (1992).Google Scholar
10 Stroscio, J.A., Pierce, D.T., Stiles, M., Zangwill, A., and Sander, L.M., Phys. Rev. Lett. 75, 4246 (1995).Google Scholar
11 Amar, J.G. and Family, F., (to be published).Google Scholar
12 Family, F. and Amar, J.G., elsewhere in this volume.Google Scholar
13 Evans, J.W., Sanders, D.E., Thiel, P. A., and DePristo, A.E., Phys. Rev. B 41, 5410 (1990); H.C. Kang and J.W. Evans, Surface Science 271, 321 (1992).Google Scholar
14 Stroscio, J.A., Pierce, D.T., and Dragoset, R.A., Phys. Rev. Lett. 70, 3615 (1993).Google Scholar
15 Stroscio, J.A. and Pierce, D.T., Phys. Rev. B 49, 8522 (1994).Google Scholar
16 Amar, J.G. and Family, F., Phys. Rev. B 52, 13801 (1995).Google Scholar
17 Kardar, M., Parisi, G., and Zhang, Y.-C., Phys. Rev. Lett. 56, 889 (1986).Google Scholar