Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-13T05:57:41.830Z Has data issue: false hasContentIssue false

Characterization of Quantum Heterostructures. A Simulation Method Combining the Evaluation of Lattice and Electrons Configuration and TEM Imaging.

Published online by Cambridge University Press:  15 February 2011

G. Mattei
Affiliation:
C.N.R.-Istituto LAMEL, via Gobetti 101, 1-40129-Bologna, Italy..
A. M. Mazzone
Affiliation:
C.N.R.-Istituto LAMEL, via Gobetti 101, 1-40129-Bologna, Italy..
Get access

Abstract

This work analyzes the characterization of the structural properties of quantum heterostructures by HREM. A simulation of atomistic type is used to construct a Fe/Ag bilayer few nm thick and the HREM image of this structure is calculated by using a standard dynamical diffraction method. The comparison of the two calculations indicates that the interfacial disorder spans few layers and can be resolved against the background of two well-registered lattices.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Kobayashi, K., Phys.Rev.B 48, 3, 1757 (1993).Google Scholar
2 Mattei, G. and Mazzone, A.M., Ultramicroscopy, in press.Google Scholar
3 Stadelmann, P. A., Ultramicroscopy 21, 131 (1987).Google Scholar
4 Freeman, A. J., Fu, C.L. and Oguchi, T., Mat.Res.Soc. Symp.Proc. 63, 1 (1985).Google Scholar
5 Mazzone, A. M., Int.Jour.Mod.Phys.C, in press.Google Scholar
6 QCPE program number 571Google Scholar
7 Kuk, Y. and Feldman, L. C., Phys.Rev.B 30, 5811 (1984)Google Scholar
8 Ercolessi, F., Tosatti, E. and Parrinello, M., Phys.Rev.Lett. 57, 6 (1986).Google Scholar