Hostname: page-component-7479d7b7d-68ccn Total loading time: 0 Render date: 2024-07-11T15:46:10.956Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization Of Glass-Ceramic Dielectric Thick Films With Cu Conductors for Multilayer Packages

Published online by Cambridge University Press:  10 February 2011

Yong S. Cho ,
Metin Koyuncu ,
Walter A. Schulze  and
Vasantha R. W. Amarakoon
Yong S. Cho
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802
Metin Koyuncu
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802
Walter A. Schulze
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802
Vasantha R. W. Amarakoon
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802
Get access

Abstract

Compatibility and characteristics of multilayer dielectric thick films with Cu interlayers are influenced by composition and processing parameters. In this work, cordierite based dielectric thick films on a Cu plated alumina substrate were investigated in terms of microstructure and property by changing composition of oxide additives, PbO and Cu2O for a given heating schedule. A nonstoichiometric cordierite composition, 2.4MgO 2Al2O3 5SiO2 was used with nucleating agents, B2O3 and P2O5. The dielectric ink consisting of cordierite glass frit and acrylic based binder vehicles was deposited on oxidized Cu layers via screen printing. The thick film layers were fired at 950°C for 30 min in N2 atmosphere. Dissolution of the oxidized Cu into the cordierite layer was observed. The addition of a small amount of Cu2O to the cordierite layer was effective in preventing the dissolution and enhancing thermal expansion. Crystallization was also influenced by the Cu2O addition. A lower activation energy value of 79 kcal/mol for crystallization, calculated from DTA runs, suggested that Cu20 could be used to form the cordierite glass-ceramic at a lower temperature. In the case of no additive, the activation energy for crystallization was 98 kcal/mol. The addition of Cu2O increased dielectric constant. For 3wt% PbO and 1wt% Cu2O, the dielectric constant and loss were determined at 1 MHz as 6.1 and 0.0046, respectively.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 445: Electronic Packaging Materials Science IX , 1996 , 313
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Bridge, D. R., Holland, D. and McMillan, P. W., Glass Tech., 26, p286 (1985)Google Scholar
2 Knickerbocker, S. H., Kumar, A. H. and Herron, L. W., Am. Ceram. Soc. Bull., 72, p90 (1993).Google Scholar
3 Tummala, R. R., J. Am. Ceram. Soc, 74, p895 (1991).Google Scholar
4 Cho, Yong S., Schulze, W. A. and Amarakoon, V. R. W., submitted for publication in J. Am. Ceram. Soc. Google Scholar
5 Cho, Yong S., Schulze, W. A. and Amarakoon, V. R. W., unpublished work.Google Scholar
6 Niwa, N., Kamehara, N., Yokoyama, H., Yokouchi, K. and Kurihara, K., Advances in Ceramics, Vol. 19, Multilayer Ceramic Devices. American Ceramic Society, Westerville. OH, 1986, pp41–48.Google Scholar
7 Zdaniewski, W., J. Am. Ceram. Soc, 58, pl63 (1975).Google Scholar
8 Kissinger, H. E., J. Res. Nati. Bur. Stand., 57, p217 (1956).Google Scholar
9 Ramanathan, S., Muraleedharan, R. V., Roy, S. K. and Nayar, P. K. K., J. Am. Ceram. Soc, 78, p429 (1995).Google Scholar
10 Matusita, K. and MacKenzie, J. D., J. Non-Cryst. Solids, 30, p285 (1979).Google Scholar
11 Cohen, B. M., Uhlmann, D. R. and Shaw, R. R., J. Non-Cryst. Solids, 12, pl77 (1973).Google Scholar