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Characterisation of Secondary Phases in Cu Poor CuInSe2: Surface and in-depth resolved Raman scattering analysis of polycrystalline layers

Published online by Cambridge University Press:  31 January 2011

Victor Izquierdo-Roca ,
Xavier Fontané ,
Lorenzo Calvo-Barrio ,
Jacobo Álvarez-García ,
Alejandro Pérez-Rodríguez ,
Joan Ramón Morante ,
Wolfram Witte  and
Reiner Klenk
Victor Izquierdo-Roca
Affiliation:
vizquierdo@el.ub.es, Universitat de Barcelona, Barcelona, Spain
Xavier Fontané
Affiliation:
xfontane@el.ub.es, Universitat de Barcelona, Barcelona, Spain
Lorenzo Calvo-Barrio
Affiliation:
lorenzo@giga.sct.ub.es, Universitat de Barcelona, Barcelona, Spain
Jacobo Álvarez-García
Affiliation:
jacobo.alvarez@cric.cat, CRIC, Barcelona, Spain
Alejandro Pérez-Rodríguez
Affiliation:
perez-ro@el.ub.es, Universitat de Barcelona, Barcelona, Spain
Joan Ramón Morante
Affiliation:
morante@el.ub.es, Universitat de Barcelona, Barcelona, Spain
Wolfram Witte
Affiliation:
wolfram.witte@zsw-bw.de, Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Stuttgart, Germany
Reiner Klenk
Affiliation:
klenk@helmholtz-berlin.de, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany
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Abstract

This work reports the surface and in-depth resolved Raman scattering analysis of polycrystalline CuInSe2 layers grown with different chemical composition, as function of the Cu to In content ratio (0.48 ≤ × ≤ 1.14). Measurements performed at the surface of the Cu-poor layers corroborate the formation of both Cu-poor Ordered Vacancy Compound (OVC) and CuAu ordered CuInSe2 phases for compositions corresponding to x ≤ 0.82 (OCV) and x ≤ 0.66 (CuAu), respectively. In-depth resolved measurements performed on the layers with lower Cu content have allowed observing a strong decrease with the depth of the intensity of the Raman peak from the chalcopyrite ordered CuInSe2 phase. This suggests a preferential formation of both OVC and CuAu ordered phases at the region close to the interface with the back Mo layer. On the other hand, the comparison between the spectra directly measured on the front and back surfaces of the layers -after removal of the layers from the Mo coated glass substrates- suggests also a worsening of the crystalline quality at the back region of the layers in the whole range of compositions.

Keywords

Raman spectroscopyII-VIphotovoltaic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1165: Symposium M – Thin-Film Compound Semiconductor Photovoltaics–2009 , 2009 , 1165-M05-16
Copyright
Copyright © Materials Research Society 2009

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