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Bright Contrast Imaging of Carbon Nanofiber-Substrate Interface using Scanning Electron Microscopy

  • Makoto Suzuki (a1), Yusuke Ominami (a2), Quoc Ngo (a3), Toshishige Yamada (a4), Bill Roth (a5), Mark Betts (a6), Alan M. Cassell (a7), Jun Li (a8) and Cary Y. Yang (a9)...

Abstract

Scanning electron microscopy (SEM) for imaging the interface between carbon nanofibers (CNFs) and the underlying substrate is presented. By irradiating the electron beam perpendicular to the substrate, bright contrast is observed at the region where a small gap exists between the CNF and substrate. The energy-diameter diagram for the observation of the bright contrast is derived, which can be understood by using the theory of electron penetration into solid. Monte Carlo simulation is performed to reproduce the experimental observation based on our model, and the contrast sensitivity to the gap height is discussed.

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Keywords

Bright Contrast Imaging of Carbon Nanofiber-Substrate Interface using Scanning Electron Microscopy

  • Makoto Suzuki (a1), Yusuke Ominami (a2), Quoc Ngo (a3), Toshishige Yamada (a4), Bill Roth (a5), Mark Betts (a6), Alan M. Cassell (a7), Jun Li (a8) and Cary Y. Yang (a9)...

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