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Binary Synaptic Connections Based on Memory Switching in a-Si:H for Artificial Neural Networks

Published online by Cambridge University Press:  26 February 2011

A. P. Thakoor
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology Pasadena, CA 91109
J. L. Lamb
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology Pasadena, CA 91109
A. Moopenn
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology Pasadena, CA 91109
S. K. Khanna
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology Pasadena, CA 91109
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Abstract

Nonvolatile, associative electronic memory based on neural network models promises high (109 bits/cm2 ) information storage density since the information is stored in a matrix of only two-terminal, passive interconnections (synapses). An electronic memory switch at each interconnect would be ideal as a programmable synapse. The massive parallelism in the architecture, however, requires that the ‘ON’ state of a synaptic connection must be unusually ‘weak’ (i.e., highly resistive). For example, a binary synapse should be 106Ω in its ‘ON’ state and >109Ω in the ‘OFF’ state for a 1024 × 1024 matrix (256 K bits of programmable read only memory, PROM). The small deliverable switching energy dictated by the resistive ‘ON’ state requirement is a new constraint for switching in thin films. Memory switching in hydrogenated amorphous silicon (a-Si:H) along with ballast (current limiting) resistors patterned from resistivity-tailored, amorphous Ge-metal alloys are investigated for a binary PROM matrix. A lμm2 area of a-Si:H could be switched from a 1010Ω (OFF state) to 105Ω (ON state) by a voltage pulse of lpsec duration, with the switching energy of 1 nanojoule, delivered through a 106Ω ballast resistor. Programmable, read-only, 1600 synapse (40x40) test arrays of uniform connection strengths (variation ±2%) and a-Si:H switching elements have been fabricated. Suitability of the memory switching in a-Si:H for high-density neural networks is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

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