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Atomic-Scale Analysis of Plasma-Enhanced Chemical Vapor Deposition from SiH4/2 Plasmas on Si Substrates

Published online by Cambridge University Press:  10 February 2011

Shyam Ramalingam ,
Dimitrios Maroudas  and
Eray S. Aydil
Shyam Ramalingam
Affiliation:
Department of Chemical Engineering, University of California, Santa Barbara, CA 93106-5080
Dimitrios Maroudas*
Affiliation:
Department of Chemical Engineering, University of California, Santa Barbara, CA 93106-5080
Eray S. Aydil
Affiliation:
Department of Chemical Engineering, University of California, Santa Barbara, CA 93106-5080
*
a)To whom correspondence should be addressed; E-mail: diniitris@calypso.ucsb.edu
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Abstract

We present a systematic atomic-scale analysis of the interactions of SiH3radicals originating in silane containing discharges with Si(001)-(2×1) and H-terminated Si(001)-(2×1) surfaces. Through simulations, we show that the hydrogen coverage of the surface is the key factor that controls both the surface reaction mechanism and the reaction probability. The SiH3radical reacts readily with the pristine Si(001)-(2×1) surface during the initial stages of growth while its reactivity with the corresponding H-terminated surface is considerably lower. Deposition of a-Si:H from SiH3 radicals has also been simulated by repeatedly impinging SiH3 radicals onto Si(001)-(2×1) surfaces maintained at 500 °C. During deposition under these conditions, the dominant mechanism of hydrogen removal from the surface is through abstraction by SiH3 radicals, which subsequently return to the gas phase as silane. The important reaction processes that take place during film growth have been identified and their energetics has been analyzed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 507: Symposium A – Amorphous & Microcrystalline Silicon Technology 1998 , 1998 , 673
Copyright
Copyright © Materials Research Society 1998

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References

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