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Atomic Force Microscope Designs and Applications

  • P. J. Bryant (a1), R. G. Miller (a1), R. H. Deeken (a1) and M. A. Pederson (a1)

Abstract

Atomic force microscopes (AFM) have been designed and tested. A simple reliable version with high resolving power is described here. Materials of construction and operational parameters are reported. Applications to a range of materials has confirmed the general usefulness of AFM technology to materials research.

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References

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1. Hansma, P.K., Elings, V.B., Marti, O., Bracker, C.E., Science, 242, 209–16 (1988).
2. Binnig, G., Quate, C. F. and Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986).
3. Binnig, G., Gerber, Ch., Stoll, E., Albrecht, T.R., and Quate, C.F., Europhys. Lett. 3, 1281 (1987).
4. Yang, R., Miller, R., and Bryant, P.J., J. Appl. Phys. 63 (2) 570–2 (1988).
5. Bryant, P.J., Miller, R.G., and Yang, R., Appl. Phys. Lett. 52 (26) 2233–5 (1988).
6. Bryant, P.J., Miller, R.G., Deeken, R., Yang, R. and Zheng, Y.C., Microscopy (to be published).
7. Bryant, P.J., Yang, R. and Miller, R., Trans. of the 1987 MRS Natl. Symp. (1988).

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