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Assessing Ohmic Contacts

  • H Barry Harrison (a1) and Geoffery K Reeves (a2)

Abstract

This paper reviews specific contact resistivity pc values obtained theoretically and experimently for a range of semiconducting materials. Techniques of obtaining pc values in terms of measurement, accuracy and reproducibility are then considered and matched to the semiconducting materials previously covered.

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Assessing Ohmic Contacts

  • H Barry Harrison (a1) and Geoffery K Reeves (a2)

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