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Application of the 3D X-Ray Crystal Microscope to Study Mesoscale Structure of Materials

Published online by Cambridge University Press:  15 February 2011

Gene E. Ice ,
Wenjun Liu ,
Bennett C. Larson  and
Fredrick J. Walker
Gene E. Ice
Affiliation:
Oak Ridge National Laboratory Oak Ridge TN 37831-6118
Wenjun Liu
Affiliation:
Oak Ridge National Laboratory Oak Ridge TN 37831-6118
Bennett C. Larson
Affiliation:
Oak Ridge National Laboratory Oak Ridge TN 37831-6118
Fredrick J. Walker
Affiliation:
Oak Ridge National Laboratory Oak Ridge TN 37831-6118
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Abstract

The 3D x-ray crystal microscope is an emerging tool for the study of mesoscale structure in polycrystalline materials. With this nondestructive device, local crystalline orientation, phase, elastic and plastic strain tensors can be measured with submicron spatial resolution in three dimensions. A key step in analyzing the Laue patterns from the 3D microscope is indexing the reflections, which determines the orientation of the sub-grain. With current algorithms, the angles between pairs, triplets and quadruplets of reflections are compared to theoretical angles to make guesses as to the reflection indices. The ability to index a pattern can however be compromised by both elastic and plastic deformation of a grain; elastic deformation changes the angles between reflections and plastic deformation increases the uncertainty in the centroid of each reflection. Here we report on the use of an indexing algorithm that simultaneously fits all peaks from a subgrain. This algorithm is more robust than previous methods and allows for indexing of deformed or strained grains. Some applications to studies of mesoscale materials properties are described.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 779: Symposium W – Multiscale Phenomena in Materials - Experiments and Modeling Related to Mechanical Behavior , 2003 , W5.36
Copyright
Copyright © Materials Research Society 2003

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