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Application of Mxcd to Magnetic Thin-Film Sensors

Published online by Cambridge University Press:  15 February 2011

P. J. Bedrossian ,
J. G. Tobin ,
A. F. Jankowski ,
G. D. Waddill ,
T. C. Anthony  and
J. A. Brug
P. J. Bedrossian
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94550
J. G. Tobin
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94550
A. F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94550
G. D. Waddill
Affiliation:
University of Missouri-Rolla, Rolla MO 65401
T. C. Anthony
Affiliation:
Hewlett-Packard Laboratories, Palo Alto CA 94305
J. A. Brug
Affiliation:
Hewlett-Packard Laboratories, Palo Alto CA 94305
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Abstract

While Magnetic X-ray Circular Dichroism (MXCD) has been applied extensively to the extraction of elemental magnetic moments in various magnetic multilayers, the configuration of actual devices imposes certain constraints on the application of MXCD to devices. Using a set of real, thin-film spin valve devices with varying Cu spacer layer thicknesses, we demonstrate the correlation between MXCD and magnetoresistance measurements on those devices as well as the restrictions on the interpretation of MXCD data imposed by both the device topology and the formulation of realistic error estimates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 79
Copyright
Copyright © Materials Research Society 1996

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