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Analysis of the Structure of Grain Boundaries Normal to the Boundary Plane Using Diffraction Techniques

Published online by Cambridge University Press:  25 February 2011

M. D. Vaudin ,
F. Schmückle ,
P. A. Lamarre  and
S. L. Sass
M. D. Vaudin
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
F. Schmückle
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
P. A. Lamarre
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
S. L. Sass
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
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Abstract

By recording the intensity of electron scattering along the reciprocal lattice direction normal to the interface plane of a grain boundary, diffraction data is obtained which is sensitive to the boundary structure along this direction. Kinematical calculations of the diffracted intensity profile normal to the interface show that such diffraction data can provide information on the local expansion at the interface and the rigid body translation between the two grains. Electron diffraction data obtained from a variety of different boundaries are presented and analyzed by comparison with intensity profiles calculated for various model boundary structures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 221
Copyright
Copyright © Materials Research Society 1985

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References

1. Bourret, A. and Desseaux, J., Phil. Mag. A39 (1979) 405, 419.10.1080/01418617908239281Google Scholar
2. Gaudig, W. and Sass, S.L., Phil. Mag. A39 1979) 725.10.1080/01418617908239303Google Scholar
3. Budai, J., Bristowe, P.D. and Sass, S.L., Acta Met. 31 (1983) 699.10.1016/0001-6160(83)90085-8CrossRefGoogle Scholar
4. Pond, R.C., Smith, D.A. and Clark, W.A.T., J. Micro. 102 (1974) 309.10.1111/j.1365-2818.1974.tb04642.xGoogle Scholar
5. Lamarre, P. and Sass, S.L., Scripta Met. 17 (1983) 141.10.1016/0036-9748(83)90470-2Google Scholar
6. Lamarre, P., Schmuckle, F., Vaudin, M.D. and Sass, S.L., 8th Eur. Cong. Elect. Mic., 1 (1984) 523.Google Scholar
7. Vaudin, M., Burkel, E., Lamarre, P.A., and Sass, S.L., In preparation (1984).Google Scholar
8. Peisl, H., J. Appl. Cryst., 8 (1975) 143.10.1107/S0021889875009922Google Scholar
9. Liou, K.-Y. and Peterson, N.L., Surfaces and Interfaces in Ceramic and Ceramic Metal Systems (1981), Materials Science Research, Vol.14, Plenum Press, New York.Google Scholar