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Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar+ Ion Bombardment

  • Elliott A. Eklund (a1), R. Stanley Williams (a2) and Eric J. Snyder (a2)

Abstract

The scanning tunneling microscope (STM) has been used to investigate graphite surfaces roughened by 5 keV Ar+ ion bombardment. The (0001) surfaces of several samples were etched with the same total ion dose but with different sputter rates for each surface. STM images taken after sputtering show that the roughness of the sputtered surfaces depended on the sputter rate and that the surface topography of each sample appeared self-similar over a large range of length scales. These experimental observations agree with predictions of the recently proposed Shadow Model. The two dimensional height-height correlation function is utilized as a means of quantitative analysis for STM topographs of sputtered surfaces.

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Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar+ Ion Bombardment

  • Elliott A. Eklund (a1), R. Stanley Williams (a2) and Eric J. Snyder (a2)

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