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An Hrem Investigation of a {121}L10 Boundary in Tial

Published online by Cambridge University Press:  22 February 2011

B. J. Inkson  and
C. J. Humphreys
B. J. Inkson
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge, CB2 3QZ, U.K.
C. J. Humphreys
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge, CB2 3QZ, U.K.
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Abstract

A consideration of {121}L10 boundaries in their unrelaxed form shows that there are at least three ィ2, six ィ3 and three ィ6 variants possible due to the tetragonal ordering of the L10 lattice. Experimental observations of コ-TiAl, obtained by HREM, show that two コ-grains with a true-twin orientation relationship exhibit a rigid body shift between the {111} planes perpendicular to and either side of a {121}L10 interface, and that the interfacial structure is distinct from those previously observed in f.c.c. metals.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 364: Symposium L – High-Temperature Ordered Intermetallic Alloys–VI , 1994 , 605
Copyright
Copyright © Materials Research Society 1995

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References

1. Pond, R.C. and Vitek, V., Proc. R. Soc. Lond. A 357, 453 (1977).Google Scholar
2. Medlin, D.L. et al, in Atomic-Scale Imaging of Surfaces and Interfaces edited by Biegelsen, D.K. (Mat. Res. Soc. Proc. 295, Pittsburgh, PA, 1993) pp. 91–96.Google Scholar
3. Wolf, U. et al, Phil. Mag. A 66, 6, 991 (1992).Google Scholar
4. Ernst, F. et al, Phys. Rev. Lett. 69,4, 620 (1992).Google Scholar
5. Shechtman, D., Blackburn, M.J. and Lipsitt, H.A., Metall. Trans. 5,1373 (1974).Google Scholar
6. Kad, B.K., Hazzledine, P.M. and Fraser, H.L., in Defect-Interface Interactions edited by Kvam, E.P. et al (Mat. Res. Soc. Proc. 319, Pittsburgh, PA, 1994) pp. 311.Google Scholar
7. He, L.L., Ye, H.Q., Ning, X.G., Cao, M.Z. and Han, D., Phil. Mag. A 67, 5, 1161 (1993).Google Scholar
8. Inui, H., Oh, M.H., Nakamura, A. and Yamaguchi, M., Phil. Mag. A 66,4, 539 (1992).Google Scholar
9. Saxton, W.O., SEMPER image analysis subroutines (1993).Google Scholar
10. Kilaas, R., Crystal Kit and MacTempas, Computer simulation software (1988).Google Scholar
11. Singh, S.R. and Howe, J.M., Phil. Mag. Lett. 65, 5, 233 (1992).Google Scholar