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An Exploration of Microscopy for Educational Applications in the High School Classroom

  • Ryan Fitzsimmons (a1), Robert Koekkoek (a2), Christine Caragianis-Broadbridge (a3), Ann Hein Lehman (a4) and Karen Cummings (a5)...

Abstract

This project was initiated with an undergraduate student’s exploration of two advanced research tools: the scanning electron microscope (SEM) and the atomic force microscope(AFM). A research project was developed to study the application of microscopy to introductory physics instruction. Nine modules covering various aspects of introductory physics were created. Module components included discussions, laboratory experiments and assessments. Four of the nine modules were implemented in various high school classes. Assessments were used to compare student learning with the modules versus standard textbook/lecture techniques. Preliminary results of this study are presented along with recently developed methods created to facilitate implementation of these modules within the high school classroom.

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1 New Milford High School, New Milford, CT

2 Ridgefield High School, Ridgefield, CT

3 Center for Research on Interface Structures and Phenomena (CRISP), an NSF MRSEC

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