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An Auger and XPS Study on CVD and Natural Diamonds

Published online by Cambridge University Press:  10 February 2011

Jane Y. Howe
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, NY 14802, jonesl@alfred.edu
Linda E. Jones
Affiliation:
New York State College of Ceramics, Alfred University, Alfred, NY 14802, jonesl@alfred.edu
David N. Braski
Affiliation:
The High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN 37831
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Abstract

CVD diamond films, ET 100 of Norton Diamond Film, were treateds in ultrahigh purity O2 from 420 to 575°C at 95 kPa. Auger and x-ray photoelectron spectra were collected from CVD and natural diamond surfaces. The Auger KVV line shapes of the CVD diamond with various surface conditions were compared to those of natural diamonds and sp2-bound graphite (HOPG) and glassy carbon. Comparisons were made on the peak shape of A1, which is the major satellite peak of carbon KVV. Auger KVV line shaped of oxidized CVD diamonds were more similar to that of natural diamond than either HOPG or glassy carbon. XPS is more sensitive to the change of surface chemisorbed species. The C Is binding energy of oxygenated and oxidized CVD diamonds (287.3 eV) was higher than that of natural diamond (285.7 eV), graphite (283.0 eV) and glassy carbon (284.2 eV). Auger and XPS findings indicated that when treated in O2 from 420 to 575°C at 95 kPa, direct oxidation of CVD diamond occurred without graphitization

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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