Hostname: page-component-7479d7b7d-jwnkl Total loading time: 0 Render date: 2024-07-12T01:33:51.405Z Has data issue: false hasContentIssue false

An Atomic View of Surface Diffusion on Metals

Published online by Cambridge University Press:  26 February 2011

Gert Ehrlich*
Affiliation:
Coordinated Science Laboratory University of Illinois at Urbana-Champaign Urbana, IL 61801
Get access

Abstract

Atomic migration in crystals is obscured by the crystal itself, and it has therefore taken ingenious indirect methods to study the diffusion process. In contrast, diffusion at surfaces is amenable to fairly direct examination, on the atomic level, through the use of the field-ion microscope. By combining measurements of the mean-square displacement with determinations of the distance distribution function, considerable detail about atomic jumps in diffusion can be obtained. Here we will briefly review results obtained by field-ion microscopic examination of single metal atoms and metal clusters diffusing on metal crystals.

What is noteworthy in the diffusion of single metal atoms is the variety of behavior which is dictated by the nature of the substrate, and the occasional complexity of the diffusion process. Examples of substrate-specific effects in atomic migration will be given for both fcc and bcc metals. Another surprising aspect of diffusion on metal surfaces is the role of clusters. These are stable at relatively high temperatures, and often diffuse at rates comparable to those of single atoms. The status of such cluster studies will be briefly examined, not only for their significance in surface transport, but also for their interest in understanding cohesion at metal surfaces.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Ayrault, G., and Ehrlich, G. (1974). J. Chem. Phys. 60, 281 Google Scholar
Bassett, D. W. (1976).J. Phys. C9, 2491 Google Scholar
Bassett, D. W., and Webber, P. R. (1979).Surf. Sci. 70, 520 Google Scholar
Bassett, D. W. (1983. In “Surface Mobilities on Solid Materials” (Binh, V. T., ed.) p. 63, 83. Plenum Press, New York CrossRefGoogle Scholar
Ehrlich, G. (1966).J. Chem. Phys. 44, 1050 Google Scholar
Ehrlich, G. (1983). In“Proc. 9th Internat'l Vacuum Congr. and 5th Internat'l Conf. on Solid Surfaces” (de Segovia, J. L., ed.), p. 3. ASEVA, Madrid Google Scholar
Ehrlich, G., and Hudda, F. G. (1966).J. Chem. Phys. 44, 1039 CrossRefGoogle Scholar
Feller, W. (1966). SIAM (Soc. Ind. Appl. Math.) J. Appl. Math. 14, 864 Google Scholar
Fink, H.-W., and Ehrlich, G. (1984). J. Chem. Phys. 81, 4657 Google Scholar
Fink, H.-W., and Ehrlich, G. (1985).Surf. Sci. 150, 419 Google Scholar
Müller, E. W., and Tsong, T. T. (1969). “Field Ion Microscopy”. American Elsevier, New YorkGoogle Scholar
Reed, D. A., and Ehrlich, G. (1975).Philos. Mag. 32, 1095 Google Scholar
Reed, D. A., and Ehrlich, G. (1985). Surf. Sci. 151, 143 CrossRefGoogle Scholar
Stolt, K., Graham, W. R., and Ehrlich, G. (1976). J. Chem. Phys. 65, 3206 Google Scholar
Stolt, K., and Ehrlich, G. (1979). TSM-AIME Fall Meeting, Milwaukee, WI.Google Scholar
Twigg, M. E. (1978). Coordinated Science Lab. Rep. R-811, University of Illinois at Urbana-Champaign.Google Scholar
Wrigley, J. D., and Ehrlich, G. (1980). Phys. Rev. Lett. 44, 661 Google Scholar
Wrigley, J. D., and Ehrlich, G. (1985). J. Vac. Sci. Technol. A3, 1572 Google Scholar