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ACID/BASE Interactions with Silicon Carbide Fiber

Published online by Cambridge University Press:  21 February 2011

Sheldon P. Wesson
Affiliation:
TRi/Princeton, P. O. Box 625, Princeton, NJ 08542
Ronald E. Allred
Affiliation:
PDA Engineering, Materials Development Department, 3754 Hawkins NE, Albuquerque, NM 87109
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Abstract

Silicon carbide fiber surfaces were analyzed by programmed thermal desorption and inverse gas chromatography, using Lewis acids and bases as probe adsorbates to compare the effect of RF glow discharge plasma and thermal treatment on surface energetics. Changes in surface acid/base character were correlated with wetting data, surface titrations, and surface chemical composition deduced from x-ray photoelectron spectroscopy. Thermal treatment did not alter fiber surface energetics significantly. Plasma treatment rendered the surface more acidic and more basic. XPS and thermal desorption analysis indicate that the plasma removed: strongly adsorbed organic contaminants, exposing and activating the underlying glassy surface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

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