Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-07-02T15:38:17.834Z Has data issue: false hasContentIssue false

XPS Characterization of Mixed Carbides Obtained from Polymer Precursors

Published online by Cambridge University Press:  28 February 2011

Gaetano Granozzi
Affiliation:
Dipartimento di Chimica Inorganica, University of Padova, Via Loredan 4, 35131 Padova (Italy)
Antonella Glisenti
Affiliation:
Dipartimento di Chimica Inorganica, University of Padova, Via Loredan 4, 35131 Padova (Italy)
Gian D. Soraru
Affiliation:
Dipartimento di Ingegneria dei Materiali, University of Trento, 38050 Mesiano, Trento (Italy)
Get access

Abstract

Polymer precursors for Si-C, Si-Ti-C-O and Si-Al-C-O systems have been obtained from polycarbosilane and the corresponding metal alkoxides. X-ray Photoelectron Spectroscopy (XPS) has been used to follow the structural evolution of these preceramic compounds during the pyrolysis process.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Pouskouleli, G., Ceram. Internat. 15, 213 (1989).Google Scholar
[2] Bender, B. A., Rice, R. W. and Spann, J. R., J. Am. Ceram. Soc. 70, C58 (1987).Google Scholar
[3] Yajima, S., Hayashi, J. and Omori, M., Chem. Lett. 931 (1975).Google Scholar
[4] Yajima, S., Iwai, T., Yamamura, T., Okamura, K. and Hasegawa, Y., J. Mat. Sci. 16, 1349 (1981).Google Scholar
[5] Babonneau, F., Soraru, G. D. and Mackenzie, J. D., submitted for publication.Google Scholar
[6] Soraru, G. D., Babonneau, F. and Mackenzie, J. D., see this volume.Google Scholar
[7] Wagner, C. D., Riggs, W. M., Davis, L. E.; Moulder, J. F. and Muilenberg, G. E., Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics Division, Perkin-Elmer Corp., Eden Prairie, MN, 1979.Google Scholar
[8] Soraru, G. D., Babonneau, F. and Mackenzie, J. D., J. Mat. Sci., to be published.Google Scholar
[9] Soraru, G. D., Glisenti, A., Granozzi, G., Babonneau, F. and Mackenzie, J. D., submitted for publication.Google Scholar
[10] Babonneau, F., Soraru, G. D. and Mackenzie, J. D., J. Mat. Sci., to be published.Google Scholar