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Transmission Electron Microscopy Study of Cascade Collapse in Copper During in- Situ Ion- Irradiation at Elevated Temperatures

Published online by Cambridge University Press:  10 February 2011

T. L. Daulton
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne IL, 60439.
M. A. Kirk
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne IL, 60439.
L. E. Rehn
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne IL, 60439.
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Abstract

The basic mechanisms driving the collapse of point defects produced in collision cascades are investigated by transmission electron microscope (TEM) characterization of defect microstructures produced in fcc-Cu irradiated with low-fluences of heavy (100 keV Kr) ions at elevated temperature (23–600°C). Areal defect yields are determined from direct TEM observation of the total defect production integrated over the duration of the in-situ ion-irradiation. They are unequivocally demonstrated to decrease with increasing lattice temperature. This decrease in defect yield indicates a proportional decrease in the probability of collapse of cascade regions into defects of size where visible contrast is produced in a TEM.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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Transmission Electron Microscopy Study of Cascade Collapse in Copper During in- Situ Ion- Irradiation at Elevated Temperatures
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