Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-19T05:22:42.290Z Has data issue: false hasContentIssue false
  • English
  • Français

Tem Observations of Grain Boundaries in Ceramics

Published online by Cambridge University Press:  21 February 2011

M. Rühle
M. Rühle*
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissen-schaften, Seestraße 92, 7000 Stuttgart 1, West-Germany.
Get access

Abstract

Grain boundaries in ZrO2-containing alumina, ZrO2, and in Ni1−yO (containing different impurities) were investigated by TEM including analytical studies. Quite frequently, interphases exist at the boundaries. The interphases are composed mainly by impurities present in the materials. The “width” of boundaries in Ni1-yO depends on intrinsic defects as well as on impurities; the dependency will be discussed. The observations are related to properties of the different ceramics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 317
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kingery, W.D., J. Amer. Ceram. Soc. 57 (1974) 1; 74.Google Scholar
2. Duffy, D.M. and Tasker, P.W., Phil. Mag. A47 (1983) 817;Google Scholar
A48 (1983) 155.Google Scholar
3. Wolf, D., J. de Physique 43 (1982) C6–45.Google Scholar
4. Tasker, P.W. and Duffy, D.M., Phil. Mag. A 47 (1983) L45.Google Scholar
5. Duffy, D.M. and Tasker, P.W., Adv. in Ceramics, Vol. 12 (1984) in the press.Google Scholar
6. Smith, D.A. and Pond, R.C., Int. Met. Rev. 205 (1976) 61.Google Scholar
7. Rühle, M., J. de Physique 43 (1982) C6–115.Google Scholar
8. Schubert, H., Claussen, N. and Rühle, M., Adv. in Ceramics, Vol. 11 (1984) in the press.Google Scholar
9. Claussen, N., J. Amer. Ceram. Soc. 61 (1978) 85.Google Scholar
10. Heuer, A.H., Claussen, N., Kriven, W.M. and Rühle, M., J. Amer. Ceram. Soc. 65 (1982) 642.Google Scholar
11. Clarke, D., Ultramicroscopy 4 (1979) 33.Google Scholar
12. Rühle, M. and Sass, S.L., Proc. 10th Int. Congress Electron Microscopy 2 (1982) 99;Google Scholar
Phil. Mag., to be published.Google Scholar
13. Puls, M.P., unpublished research. See also:Google Scholar
Puls, M.P. and Norgett, M.J., J. Appl. Phys. 47 (1976) 466.Google Scholar