Hostname: page-component-7479d7b7d-t6hkb Total loading time: 0 Render date: 2024-07-12T11:22:38.580Z Has data issue: false hasContentIssue false

A Study of the Photovoltaic effect of A Semiconductor Grain Boundary by A Scanning Laser Beam

Published online by Cambridge University Press:  26 February 2011

Jerng-Sik Song
Affiliation:
Department of Electrical Engineering Columbia University, New York, NY 10027
Edward S. Yang
Affiliation:
Department of Electrical Engineering Columbia University, New York, NY 10027
Get access

Abstract

Experimental observation of the photovoltaic effect of a semiconductor grain boundary with a scanning laser beam is analyzed assuming a single trap energy level. The photo-current is calculated from the recombination velocity and the concentration of minority carriers at a grain boundary which was derived from the continuity equation. Open circuit voltage across a sample is obtained from equating this recombination current to compensating thermionic emission current. Using recombination velocity and diffusion length as variables, tha calculated open circuit voltage is compared with experimental data.

Type
Research Article
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Taylor, W. E., Odel, N. H. and Fan, H. Y., Phys. Rev., 88, 867 (1952).Google Scholar
2. Mataré, H. F., Kedesdy, H., MacDonald, A., and Petersen, A., Phys. Rev., 98, 1179 (1955).Google Scholar
3. Mueller, R. K., J. Appl. Phys., 32, 640 (1961).Google Scholar
4. Rai-Choudhuri, P. and Hower, P. L., J.Electrochem. Soc, 120, 1761 (1973).Google Scholar
5. Read, W. T., Phil. Mag., 45, 775 (1954).Google Scholar
6. Queisser, H. J., Hubner, K. and Shockley, W., Phys. Rev. 123, 1245 (1961).Google Scholar
7. Kamins, T. I., J. Appl. Phys., 42, 4357 (1971).Google Scholar
8. Seto, J. Y. W., J.Electrochem. Soc., 122, 701 (1975).Google Scholar
9. Hu, Chenming and Drowley, Clifford, Solid State Elec, 21, 965 (1978).Google Scholar
10. Martinez, J., Criado, A. and Piqueras, J., J. Appl. Phys., 52, 1301 (1981).Google Scholar
11. Seager, C. H., J. Appl. Phys., 52, 3960 (1981).Google Scholar
12. Mareck, Jiri, J. Appl. Phys., 53, 1454 (1982).Google Scholar
13. Panayotatos, P., Yang, E. S. and Hwang, W., Solid State Elec, 25, 417 (1982).Google Scholar
14. van Roosebroeck, W., J. Appl. Phys., 26, 380 (1955).Google Scholar
15. Shockley, W. and Read, W. T., Phys. Rev., 87, 835 (1952).Google Scholar
16. Brews, J. R., in Physics of the MOS Transistor in Silicon Integrated Circuits, edited by Kahng, D. (Academic Press, New York, 1981), p. 7.Google Scholar
17. Petritz, R. L., Phys. Rev. 104, 1508 (1956).Google Scholar
18. Wu, C.M. and Yang, E. S., Appl. Phys. Lett., 40, 49 (1982).Google Scholar