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Study Of The Growth Mechanisms of NbS2 Scales Using Marker Experiments

Published online by Cambridge University Press:  16 February 2011

Chuxin Zhou  and
L. W. Hobbs
Chuxin Zhou
Affiliation:
Department of Materials Science & Engineering, MIT, Cambridge, MA 02139
L. W. Hobbs
Affiliation:
Department of Materials Science & Engineering, MIT, Cambridge, MA 02139
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Abstract

ABSTRACT Au thin films were deposited using electron beam evaporation onto the surface of Nb metal to serve as thin film markers to study the growth mechanisms of NbS2 scales. Scanning Auger microscopy (SAM) was used to measure the depth profiles for the compositions of Au, Nb, S, Si and O across the sulfide scale. Three other marker experiments were also studied. All four marker experiments indicated that the inward diffusion of sulfur is the dominant process responsible for the growth of NbS2 scales.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 222: Symposium D – Atomic Layer Growth and Processing , 1991 , 321
Copyright
Copyright © Materials Research Society 1991

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References

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