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Sputtered Bismuth thin films as trace metal electrochemical sensors

Published online by Cambridge University Press:  07 January 2013

J. Baron
Affiliation:
Instituto de Investigaciones en Materiales, UNAM. Circuito Exterior s/n, C.U., C.P. 04510, Mexico D.F., Mexico.
P. Silva-Bermudez
Affiliation:
Instituto de Investigaciones en Materiales, UNAM. Circuito Exterior s/n, C.U., C.P. 04510, Mexico D.F., Mexico.
S.E. Rodil
Affiliation:
Instituto de Investigaciones en Materiales, UNAM. Circuito Exterior s/n, C.U., C.P. 04510, Mexico D.F., Mexico.
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Abstract

This work studies the performance of sputtered bismuth films as disposable working electrodes for stripping voltammetry. The electrodes were produced by coating a glass substrate with a bismuth film using DC magnetron sputtering under different conditions of power and time. The Bi-based sensors were characterized by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and scanning electron microscopy. Electrochemical evaluation included linear sweep voltammetry using different buffer solution and pHs to observe the effect of the deposition conditions and thickness on the potential window accessible for stripping analysis. Subsequently, the electrodes were tested for the detection of low concentrations of trace metals (Cd(II) and Pb(II)) by square wave anodic stripping voltammetry (SWASV). Clear and reproducible stripping peaks were observed for trace concentrations in the 50 - 450 ppb range of the target analytes. The detection limit of the Bi electrodes were quantitatively estimated from the analyses of SWASV, demonstrating that even using simple sensor geometry, detection limits in the 14-20 ppb range could be obtained. The reproducibility of the measurements is good (relative standard deviations about 4%) after 10 consecutive measurements which define the maximum number of times that the sensor can be used.

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Articles
Copyright
Copyright © Materials Research Society 2012 

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References

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