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Solute Partitioning and Interfacial Segregation in TiAl-Based Alloys

Published online by Cambridge University Press:  10 February 2011

D. J. Larson
Affiliation:
Microscopy and Microanalysis Group, Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783 1-6376, larsondj @ornl.gov
M. K. Miller
Affiliation:
Microscopy and Microanalysis Group, Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783 1-6376, larsondj @ornl.gov
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Abstract

Atom probe microscopy has been used to investigate elemental partitioning and segregation behavior in a TiAl-based alloy with a variety of alloying additions including Cr, Nb, W and B. These results indicate that in a stress-relieved state (2 h at 900°C) and a reheated state (2 h at 900°C, 2184 h at 800°C and 2 h at 1210°C) chromium, and to a lesser extent tungsten, is partitioned to the α2 phase. However, in an annealed state (2 h at 900°C and 720 h at 800°C), these elements are partitioned to the, γ phase. Segregation of chromium and tungsten to lamellar interfaces is observed in the stress-relieved material, but significant segregation was not observed in material subjected to the other heat treatments. A W- and B-enriched precipitate was observed in the reheated material and provides a possible explanation for the low tungsten concentrations measured in the matrix phases.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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