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SnO2:F Thin Films with High Fluorine Contents Produced by Spray Pyrolysis at Constant Substrate Temperature

Published online by Cambridge University Press:  10 February 2011

D. R. Acosta
Affiliation:
Instituto de Física, UNAM, A.P. 20 - 364, 01000 México D.F., MEXICO
E. Zironi
Affiliation:
In Memorian
W. Estrada
Affiliation:
Universidad Nacional de Ingeniería, Fac. de Ciencias. Casilla 31 – 139. Lima, PERU
E. Montoya
Affiliation:
Universidad Nacional de Ingeniería, Fac. de Ciencias. Casilla 31 – 139. Lima, PERU
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Abstract

Fluorine doped tin oxide thin films were prepared from solutions with high fluorine contents using the spray pyrolysis technique; the resulting films were studied by electron and X-ray diffraction methods; the resonant nuclear reaction (RNR) method was used to determine the final concentration of fluorine atoms in our films for different doping levels. Also, electrical and optical properties of SnO2:F films were measured and correlated with deposition and structural parameters obtained from X-Ray diffraction and electron microscopy studies.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

1. Sampson, S. and Fonstad, C.G., J. App. Phys. 44,(1973), 4618 Google Scholar
2. Chopra, K.L., Major, S. and Pandya, D.K., Thin Solid Films 102, (1983), 1 Google Scholar
3. Bruneaux, J., Cachet, H., Froment, M. and Messad, A., Thin Sol.Fil. 197, (1991), 129 Google Scholar
4. Fantini, M. and Torriani, J., Thin Solid Films, 138, (1986) 255 Google Scholar
5. Demichelis, F., Minetti, E., Smurro, V., Taglaferro, A. and Tresso, E., J.Phys. D; Appl. Phys. 18, (1985), 1825 Google Scholar
6. Haitjema, H., Proc. SPIE, 1272, (1990), 26 Google Scholar
7. Acosta, D.R., Zironi, E.P., Montoya, E and Estrada, W., Thin Solid Films (1996)Google Scholar
8. Miki-Yoshida, M. and Andrade, E., Thin Solid Films 138, (1993), 87 Google Scholar
9. Ansel, G., Nadai, J.P., D'Artemare, E., David, D., Girard, E. and Moulin, J., Nucl. Instr. Methods 92, (1971), 481 Google Scholar
10. Asomoza, R., Maldonado, A., Rickards, J., Zironi, E., Farías, M.H., Cota, L. and Soto, G. Thin Solid Films, 203,(1991), 195.Google Scholar
11. Rickards, J., Nucl.Instrum. Methods B, 5657,(1991),812 Google Scholar
12. Pommier, R., Griland, C. and Marucchi, J., Thin Solid Films. 77,(1981), 13 Google Scholar