Hostname: page-component-77c89778f8-9q27g Total loading time: 0 Render date: 2024-07-19T10:28:15.651Z Has data issue: false hasContentIssue false
  • English
  • Français

Sensing Shape Recovery using Conductivity Noise in Thin Films of NiTi Shape Memory Alloys

Published online by Cambridge University Press:  01 February 2011

U. Chandni ,
M.V. Manjula ,
Arindam Ghosh ,
H.S. Vijaya  and
S. Mohan
U. Chandni
Affiliation:
chandni@physics.iisc.ernet.in, Indian Institute of Science, Physics, Bangalore, India
M.V. Manjula
Affiliation:
manjula@physics.iisc.ernet.in, Indian Institute of Science, Physics, Bangalore, India
Arindam Ghosh
Affiliation:
arindam@physics.iisc.ernet.in, Indian Institute of Science, Physics, Bangalore, India
H.S. Vijaya
Affiliation:
hsvijaya@isu.iisc.ernet.in, Indian Institute of Science, Instrumentation, Bangalore, India
S. Mohan
Affiliation:
smohan@isu.iisc.ernet.in, Indian Institute of Science, Instrumentation, Bangalore, India
Get access

Abstract

Low frequency fluctuations in the electrical resistivity, or noise, have been used as a sensitive tool to probe into the temperature driven martensite transition in dc magnetron sputtered thin films of nickel titanium shape-memory alloys. Even in the equilibrium or static case, the noise magnitude was more than nine orders of magnitude larger than conventional metallic thin films and had a characteristic dependence on temperature. We observe that the noise while the temperature is being ramped is far larger as compared to the equilibrium noise indicating the sensitivity of electrical resistivity to the nucleation and propagation of domains during the shape recovery. Further, the higher order statistics suggests the existence of long range correlations during the transition. This new characterization is based on the kinetics of disorder in the system and separate from existing techniques and can be integrated to many device applications of shape memory alloys for in-situ shape recovery sensing.

Keywords

electrical propertiesphase transformationthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1129: Symposium V – Materials and Devices for Smart Systems III , 2008 , 1129-V13-01
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Otsuka, K. and Wayman, C. M., Shape memory Materials, (Cambridge University Press, 1998)Google Scholar
2. Chandni, U., Ghosh, A., Vijaya, H. S. and Mohan, S., Appl. Phys. Lett. 92, 112110 (2008); e-print arXiv:cond-mat/0811.0102 (2008).Google Scholar
3. Scofield, J. H., Rev. Sci. Instrum. 58, 985 (1987);Google Scholar
Ghosh, A., Kar, S., Bid, A. and Raychaudhuri, A. K., e-print arXiv:cond-mat/0402130 (2004).Google Scholar
4. Fleetwood, D. M. and Giordano, N., Phys. Rev. B 31, 1157 (1985);Google Scholar
Weissman, M. B., Rev. Mod. Phys. 60, 537 (1988).Google Scholar
5. Dutta, P. and Horn, P. M., Rev. Mod. Phys. 53, 497 (1981);Google Scholar
Scofield, J. H. and Mantese, J. V., Phys. Rev. B. 32, 736 (1985).Google Scholar
6. Perez-Reche, F. J., Vives, E., Manosa, L. and Planes, A., Phys. Rev. Lett. 87, 197501 (2001).Google Scholar
7. Laurson, L. and Alava, M. J., Phys. Rev. E. 74, 066106 (2006).Google Scholar
8. Seidler, G. T. and Solin, S. A., Phys. Rev. B. 53, 9753 (1996).Google Scholar