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Preparation of AlN thin films by means of CVD using iodide source under atmospheric pressure

Published online by Cambridge University Press:  01 February 2011

Hiroki Iwane ,
Naoki Wakiya ,
Naonori Sakamoto ,
Takato Nakamura  and
Hisao Suzuki
Hiroki Iwane
Affiliation:
rmhiwane@gmail.com, Shizuoka University, Materials Science and Chemical Engineering, 3-5-1 Johoku, Hamamatsu, 4328003, Japan
Naoki Wakiya
Affiliation:
tnwakiy@ipc.shizuoka.ac.jp, Shizuoka University, Materials Science and Chemical Engineering, 3-5-1 Johoku, Hamamatsu, 4328003, Japan
Naonori Sakamoto
Affiliation:
tnsakam@ipc.shizuoka.ac.jp, Shizuoka University, Materials Science and Chemical Engineering, 3-5-1 Johoku, Hamamatsu, 4328003, Japan
Takato Nakamura
Affiliation:
nakam-ta@adb.shizuoka.ac.jp, Shizuoka University, Materials Science and Chemical Engineering, 3-5-1 Johoku, Hamamatsu, 4328003, Japan
Hisao Suzuki
Affiliation:
tnsuzuk@ipc.shizuoka.ac.jp, Shizuoka University, Materials Science and Chemical Engineering, 3-5-1 Johoku, Hamamatsu, 4328003, Japan
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Abstract

Epitaxial aluminum nitride (AlN) thin films were successfully prepared on the (0001) sapphire substrate by chemical vapor deposition (CVD) using aluminum iodide (AlI3) and ammonia (NH3) under atmospheric pressure at 750 ºC. The crystallographic relationship between AlN thin films and Al2O3 substrate is in the following; AlN(0001)//Al2O3(0001) and AlN[1010]//Al2O3[1120]. Lattice parameters of AlN thin film measured by X-ray diffraction revealed that c=0.498 and a=0.311 nm, respectively. Residual stress estimated by modified sin2ψ method was 0.38 GPa in compressive stress. Cross-sectional TEM observation revealed that an interlayer lies between the AlN films and the sapphire substrate. It was suggested that relaxation of residual stress caused by the mismatching of lattice parameter and thermal expansion coefficient was brought about by the interlayer.

Keywords

nitridechemical vapor deposition (CVD) (deposition)crystallographic structure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1040: Symposium Q – Nitrides and Related Bulk Materials , 2007 , 1040-Q09-30
Copyright
Copyright © Materials Research Society 2008

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