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Plasma-Assisted MOCVD Growth of ZnO Thin Films

Published online by Cambridge University Press:  01 February 2011

Maria Losurdo
Affiliation:
maria.losurdo@ba.imip.cnr.it, IMIP-CNR, PLASMACHEMISTRY, VIA ORABONA 4, BARI, BARI, 70125, Italy, +39.0805443562, +39.0805442024
Maria Michela Giangregorio
Affiliation:
michelaria.giangregorio@ba.imip.cnr.it
Pio Capezzuto
Affiliation:
pio.capezzuto@ba.imip.cnr.it, IMIP-CNR, PLASMACHEMISTRY, Italy
Giovanni Bruno
Affiliation:
giovanni.bruno@ba.imip.cnr.it, IMIP-CNR, PLASMACHEMISTRY, Italy
Graziella Malandrino
Affiliation:
gmalandr@mbox.unict.it, Universita di Catania, Chemistry, Italy
Manuela Blandino
Affiliation:
gmalandr@mbox.unict.it, Universita di Catania, Chemistry, Italy
Ignazio Fragalà
Affiliation:
gmalandr@mbox.unict.it, Universita di Catania, Chemistry, Italy
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Abstract

ZnO thin films have been grown by metalorganic chemical vapor deposition (MOCVD) also plasma assisted (PA-MOCVD) on c-axis oriented sapphire (0001) and Si(001) substrates using the alternative Zn(TTA)2·tmed (HTTA=2-thenoyltrifluoroacetone,TMED=N,N,N’,N’-tetramethylethylendiamine) precursor. The structural, morphological and optical properties of ZnO films have been investigated. The results show that the O2 plasma assisted growth results in an improvement of the structure, in smoother morphologies and in a better optical quality with a sharp and intense exciton of ZnO films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

1. Pearton, S.J., Norton, D.P., Ip, K., Heo, Y.W., Steiner, T., Progress in Material Science, 50, 293 (2005) and reference therein.CrossRefGoogle Scholar
2. Robbins, J.J., Harvey, J., Leaf, J., Fry, C., Wolden, C.A., Thin Solid Films, 473, 35 (2005).CrossRefGoogle Scholar
3. CRC Handbook of Chemistry and Physics, 57th ed, CRC press, 19761977.Google Scholar
4. Malandrino, G., Blandino, M., Perdicaro, L. M. S., Fragalà, I. L., Rossi, P., Dapporto, P., Inorg. Chem., 44, xxx, (2005). DOI 10.1021/ic051175i.CrossRefGoogle Scholar
5. Bruggemann, D.A.G., Ann. Phys.(Leipzig) 24, 636 (1965).Google Scholar
6. Adachi, S. in “Optical Constants of Crystalline and Amorphous Semiconductors”, Kluwer Academic Publishers, Boston, p. 420424 (1999).CrossRefGoogle Scholar
7. Matsuda, A., Thin Solid Films 337, 1 (1999).CrossRefGoogle Scholar