Hostname: page-component-84b7d79bbc-g78kv Total loading time: 0 Render date: 2024-07-28T19:48:41.299Z Has data issue: false hasContentIssue false

Pb Induced Layer-by-Layer Growth and the Dependence on an Amount of Surfactant in the Growth of Ni on Ni(100) Surface

Published online by Cambridge University Press:  10 February 2011

M. Iwanami
Affiliation:
Institute of Industrial Science, University of Tokyo, 7–22-1 Roppongi, Minato-ku, Tokyo 106, JAPAN
M. Kamiko
Affiliation:
Institute of Industrial Science, University of Tokyo, 7–22-1 Roppongi, Minato-ku, Tokyo 106, JAPAN
T. Matsumoto
Affiliation:
Institute of Industrial Science, University of Tokyo, 7–22-1 Roppongi, Minato-ku, Tokyo 106, JAPAN
R. Yamamoto
Affiliation:
Institute of Industrial Science, University of Tokyo, 7–22-1 Roppongi, Minato-ku, Tokyo 106, JAPAN
Get access

Abstract

Surfactant epitaxy has been expected to be a powerful method to improve thin film growth from three dimensional island mode to layer-by-layer growth one. Supposing that Pb is the surfactant and Ni is the substrate and deposition metal, we have investigated how the surfactant atoms segregate on surface by computer simulations using the modified embedded atom method. To verify the effect of Pb on the homoepitaxial growth of Ni, we have performed a series of experiments on the growth of Ni on Ni(100) surface with and without Pb using reflection high energy electron diffraction (RHEED). It was clearly found that Pb induced layer-by-layer growth of Ni metal film. The result of the dependence of the growth behavior on the thickness of Pb layer suggests that there is the most suitable thickness of a surfactant layer which is not always the monolayer.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Carcia, R. F., Meinhaldt, A. D. and Suna, A., Appl. Phys. Lett. 47, 178 (1985).Google Scholar
2. Baibich, M. N., Broto, J. M., Fert, A., Dau, F. Nguyen van, Petroff, F., Etienne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
3. Broeder, F. J. A. den, Kuiper, D., Mosselaer, A. P. van de and Hoving, W., Phys. Rev. Lett. 60, 2769 (1988).Google Scholar
4. Fullerton, E. E., Kelly, D. M., Guimpel, J. and Schuller, I. K., Phys. Rev. Lett. 68, 859 (1992).Google Scholar
5. Copel, M., Reuter, M. C., Kaxiras, Efthimios and Tromp, R. M., Phys. Rev. Lett. 63, 632 (1989).Google Scholar
6. Vegt, H. A. van der, Pinxteren, H. M. van, Lohmeier, M. and Vlieg, E., Phys. Rev. Lett. 68, 3335 (1992).Google Scholar
7. Camarero, J., Spendeler, L., Schmidt, G., Heinz, K., Miguel, J. J. de and Miranda, R., Phys. Rev. Lett. 73, 2448 (1994).Google Scholar
8. Mae, K., Kyuno, K. and Yamamoto, R., Modelling Simul. Mater. Sci. Eng. 4,73 (1996).Google Scholar
9. Vegt, H. A. van der, Breeman, M., Ferrer, S., Etgens, V. H., Torrelles, X., Fajardo, P. and Vlieg, E., Phys. Rev. B 51, 14806 (1995).Google Scholar
10. Vegt, H. A. van der, Alvarez, J., Torrelles, X., Ferrer, S. and Vlieg, E., Phys. Rev. B 52, 17443 (1995).Google Scholar
11. Ehrlich, G. and Hudda, F. G., J. Chem. Phys. 44, 1039 (1966).Google Scholar
12. Rosenfeld, G., Servaty, R., Teichert, C., Poelsema, B. and Comsa, G., Phys. Rev. Lett. 71, 895 (1993).Google Scholar
13. Kunkel, R., Poelsema, B., Verheij, L. K. and Comsa, G., Phys. Rev. Lett. 65, 733 (1990).Google Scholar
14. Bott, M., Michely, T. and Comsa, G., Surf. Sci. 272, 161 (1992).Google Scholar
15. Vrijmoeth, J., Vegt, H. A. van der, Meyer, J. A., Vlieg, E. and Behm, R. J., Phys. Rev. Lett. 72, 3843 (1994).Google Scholar
16. Tersoff, J., Gon, A. W. Denier van der, and Tromp, R. M., Phys. Rev. Lett. 72, 266 (1994).Google Scholar
17. Michely, T., Hohage, M., Esch, S., and Comsa, G., Surf. Sci. 349, L89 (1996)Google Scholar
18. Venables, J. A., Spiller, G. D. T., and Hanbficken, M., Rep. Prog. Phys. 47, 399 (1984).Google Scholar
19. Stroscio, J. A., Pierce, D. T., and Dragoset, R. A., Phys. Rev. Lett. 70, 3615 (1993).Google Scholar
20. Purcell, S. T., Heinrich, B., and Arrott, A. S., Phys. Rev. B 35, 6458 (1987).Google Scholar
21. Kopatzki, E., Günther, S., Nichtl-Pecher, W., and Behm, R. J., Surf. Sci. 284, 154 (1993).Google Scholar
22. Oppo, S., Fiorentini, V., and Scheffler, M., Phys. Rev. Lett. 71, 2437 (1993).Google Scholar
23. Mae, K., Ph. D. thesis, University of Tokyo, 1994.Google Scholar