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Nanophosphor-Embedded Oxide Glass-Matrix Nanocomposite for X-ray Imaging

Published online by Cambridge University Press:  21 May 2012

Nicholas Savage
Affiliation:
Electro-Optical Systems Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta GA 30332 School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA 30332
Brent Wagner
Affiliation:
Electro-Optical Systems Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta GA 30332
Yuelan Zhang
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA 30332
Brendan Lynch
Affiliation:
Electro-Optical Systems Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta GA 30332
Hisham Menkara
Affiliation:
Electro-Optical Systems Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta GA 30332
Christopher Summers
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA 30332
Zhitao Kang*
Affiliation:
Electro-Optical Systems Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta GA 30332 School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA 30332
*
*Corresponding author. Email: zhitao.kang@gtri.gatech.edu
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Abstract

Tb doped gadolinium fluoride nanophosphors embedded in an aluminosilicate glass matrix is reported for X-ray imaging applications. The nanocomposite scintillators were prepared by a melt-quench method followed by annealing. The GdF3:Tb nanophosphors precipitated within the oxide glass matrix during the processing and their luminescence and scintillation properties were investigated.

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Articles
Copyright
Copyright © Materials Research Society 2012

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References

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