Hostname: page-component-5c6d5d7d68-tdptf Total loading time: 0 Render date: 2024-08-29T07:19:31.243Z Has data issue: false hasContentIssue false

Nanoindentation Evaluation of Brittle Films on Metals Natalia

Published online by Cambridge University Press:  17 March 2011

I. Tymiak
Affiliation:
Dept. of Chem. Eng. and Mat. Sci. (CEMS), University of Minnesota, Minneapolis, MN 55455
Antanas Daugela
Affiliation:
Hysitron, inc., Minneapolis, MN 55439
Trevor F. Page
Affiliation:
Materials Division (MMME), The University of Newcastle, Newcastle Upon Tyne, UK
William W. Gerberich
Affiliation:
Dept. of Chem. Eng. and Mat. Sci. (CEMS), University of Minnesota, Minneapolis, MN 55455
Get access

Abstract

The present study addresses two cases of brittle ceramic films on metals. With the assistance of AE as a supplementary technique, yield initiation phenomena have been evaluated for W single crystal surfaces under several nm thick native oxide film. An AE sensor coupled to an indenter tip allowed an increasing sensitivity to localized fracture and plasticity events in the vicinity of an indentation contact. A good correlation between AE signals and indentation induced plasticity and fracture has been accomplished for contacts below 100 μN. Second, mechanical behavior of porous nanocrystalline SiC films on Mo substrates was examined. An analysis was based on the P-δ2 approach. With this method, both loading and unloading parts of indentation curves obtained with sharp pyramidal indenters may be represented as P=Kδ2 where P, and δ denote indentation load and displacement respectively. The parameter K includes a material's hardness/modulus ratio and indenter geometry.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kramer, D.E., Yoder, K.B. and Gerberich, W.W., in press, Phil. Mag. (2000).Google Scholar
2. Bahr, D.F., Gerberich, W.W., J. Mater. Res., 13, 1065 (1998).Google Scholar
3. Daugela, A., Wyrobek, J. T., Proc of Intermag 2000, held in Toronto, April 9-13, 2000, HB03.Google Scholar
4. Blum, J., Tymiak, N., Neuman, A., Wong, Z., Rao, N.P., Girshick, S.L., Gerberich, W.W., Murry, P.H. Mc. and Heberlein, J. V.R., Journal of Nanoparticle Research”, 1,31, (1999).Google Scholar
5. Oliver, W.C. and Pharr, G.M., J. Mater. Res., 7, 1564 (1992).Google Scholar
6. Hainsworth, S.V., Chandler, H.W. and Page, T.F., J. Matr. Res., 11, 1987 (1996).Google Scholar
7. Sakai, M., Shimizu, S., and Ishikawa, T., J. Mater. Res., 14, 1471 (1999).Google Scholar
8. Zeng, K. and Rowcliffe, D., Phil. Mag. A, 74, 1107 (1996).Google Scholar
9. Oliver, W., MRS proceedings, this volume (2000).Google Scholar
10. Rao, N.P., Tymiak, N., Blum, J., Lee, H.J., Girshick, S.L., McMurry, P.H., Heberlein, J. V.R., J. Aerosol. Sci., 29, 707 (1998).Google Scholar
11. Barsoum, M., Fundamentals of Ceramics, McGraw Hill (1997).Google Scholar
12. Siegel, K.W., Mater. Sci. Eng., A 168, 189, (1993).Google Scholar