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Morphology and Optical Properties of ZnO Nanorods Grown by Catalyst-assisted Vapor Transport on Various Substrates

Published online by Cambridge University Press:  01 February 2011

Vitaliy Avrutin
Affiliation:
vavrutin@vcu.edu, Virginia Commonwealth University, Electrical Engineering, 601 West Main St., Richmond, VA, 23284, United States, (804)827 7000 x 357, (804)828 4269
Umit Ozgur
Affiliation:
uozgur@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
Natalia Izyumskaya
Affiliation:
nizioumskaia@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
Serguei Chevtchenko
Affiliation:
schevtchenko@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
Jacob Leach
Affiliation:
jleach@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
James C. Moore
Affiliation:
jcmoore@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
Alison A. Baski
Affiliation:
aabaski@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
Henry O. Everitt
Affiliation:
everitt@phy.duke.edu, Army Aviation & Missile RDEC, Redstone Arsenal, AL, 35898, United States
Kong-Thon Tsen
Affiliation:
tsen@asu.edu, Arizona State University, Tempe, AZ, 85287, United States
Pierre Ruterana
Affiliation:
pierre.ruterana@ensicaen.fr, ENSICAEN, CNRS,, Caen, F-14050, France
Hadis Morkoc
Affiliation:
hmorkoc@vcu.edu, Virginia Commonwealth University, Richmond, VA, 23284, United States
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Abstract

ZnO nanorods were grown by catalyst-assisted vapor phase transport on Si(001), GaN(0001)/c-Al2O3, and bulk ZnO(0001) substrates. Morphology studies showed that ZnO nanorods grew mostly perpendicularly to the GaN substrate surface, whereas a more random directional distribution was found for nanorods on Si. Optical properties of fabricated nanorods were studied by steady-state photoluminescence and time-resolved photoluminescence. Stimulated emission was observed from ZnO nanorods on GaN substrates. Raman spectroscopy revealed biaxial strain in the nanorod samples grown on Si. Conductive atomic force microscopy was applied to study I-V spectra of individual nanorods.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

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