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Improved Efficiency of Single Junction Microcrystalline Silicon n-i-p Solar Cells with an i-Layer Made by Hot-Wire CVD

Published online by Cambridge University Press:  01 February 2011

Hongbo Li
Affiliation:
h.li@phys.uu.nl, Utrecht University, Faculty of Science, Surfaces, Interfaces and devices, P.O.Box 80.000, Utrecht, 3508TA, Netherlands, ++31(30)2532345, ++31(30)2543165
Ronald H.J. Franken
Affiliation:
R.H.J.Franken@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
Robert L. Stolk
Affiliation:
R.L.Stolk@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
C. H.M. van der Werf
Affiliation:
C.H.M.vanderwerf@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
Jan-Willem A. Schuttauf
Affiliation:
j.a.schuttauf@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
Jatin K. Rath
Affiliation:
j.k.rath@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
Ruud E.I. Schropp
Affiliation:
R.E.I.Schropp@phys.uu.nl, Utrecht University, Surfaces, Interfaces and Devices, Faculty of Science, P.O.Box 80.000, Utrecht, 3508TA, Netherlands
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Abstract

The influence of the surface roughness of Ag/ZnO coated substrates on the AM1.5 J-V characteristics of microcrystalline silicon (μc-Si:H) solar cells with an i-layer made by the hot-wire chemical vapour deposition (HWCVD) technique is discussed. Cells deposited on substrates with an intermediate rms roughness show the highest efficiency. When using reverse hydrogen profiling during i-layer deposition, an efficiency of 8.5 % was reached for single junction μc-Si:H n-i-p cells, which is the highest for μc-Si:H n-i-p cells with a hot-wire i-layer.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

1Solar cell Efficiency Tables (version 29). Prog. Photovolt.: Res. Appl. 2007; 15: 3540.Google Scholar
2 Yamamoto, K, Toshimi, M, Suzuki, T, Tawada, Y, Okamoto, T, Nakajima, A., MRS Spring Meeting, April 1998; San Francisco.Google Scholar
3 Yoshimi, M, Sasaki, T, Sawada, T, Suezaki, T, Meguro, T, Matsuda, T, Santo, K, Wadano, K, Ichikawa, M, Nakajima, A, Yamamoto, K. Conference Record, 3rd World Conference on Photovoltaic Energy Conversion, Osaka, May 2003; 15661569.Google Scholar
4See, for example, 4th World Conferences on Photovoltaic Energy Conversion, or 31st IEEE Photovoltaic Specialists Conferences and the conferences hold before.Google Scholar
5 Schropp, R. E.I., Thin Solid Films 451-452 (2004) 455465.Google Scholar
6 Rath, J.K., Tichelaar, F.D., Meiling, H. and Schropp, R.E.I., Rat. Res. Soc. Symp. Proc. 507 (1998) 879.Google Scholar
7 Schropp, R.E.I., Feenstra, K.F., Molenbroek, E.C., Meiling, H., Rath, J.K., Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties, 76 (1997) 309321.Google Scholar
8 Rath, J.K., Tichelaar, F.D., Schropp, R.E.I., Solid State Phenomena 67-68 (1999) 465.Google Scholar
9 Veenendaal, P. A. T. T. van, Gijzeman, O. L. J., Rath, J. K., and Schropp, R. E. I., Thin Solid Films 395 (2001) 194197.Google Scholar
10 Werf, C. H. M. van der, Veenendaal, P. A. T. T. van, Veen, M. K. van, Hardeman, A. J., Rusche, M. Y. S., Rath, J. K. and Schropp, R. E. I., Thin Solid Films 430 (2003) 4649.Google Scholar
11 Li, H., , Stolk, R.L., , Werf, Van Der, C.H.M., , Rusche, , M.Y.S., , Rath, , J.K., , Schropp, , R.E.I., , Thin Solid Films 501 (2006) 276279.Google Scholar
12 Klein, Stefan, Wolff, Johannes, Finger, Friedhelm, Carius, Reinhard, Wagner, Heribert and Stutzmann, Martin, Jpn. J. Appl. Phys. 41 (2002) L10–L12.Google Scholar
13 Klein, S., Repmann, T. and Brammer, T., Solar Energy 77 (2004) 893908.Google Scholar
14 Veen, M. K. van, Werf, C. H. M. van der, Rath, J. K. and Schropp, R. E. I., Thin Solid Films 430 (2003) 216219.Google Scholar
15 Stolk, Robert L., Li, Hongbo, Franken, Ronald H., Werf, Karine H.M. van der, Rath, Jatindra K. and Schropp, Ruud E.I., MRS Symp. Proc. 910, A.26.03, (2006).Google Scholar
16 Li, H., Franken, R.H., Stolk, R.L., Werf, C.H.M. van der, Rath, J.K., Schropp, R.E.I., 4th international Conference on Hot-Wire CVD (Cat-CVD) process, October 4-8, 2006, Takayama, Gifu, Japan.Google Scholar
17 Franken, R.H., Phd thesis, Utrecht University, 2006.Google Scholar
18 Li, Hongbo, Franken, Ronald, Stolk, Robert, Rath, Jatin and Schropp, Ruud E. I., to be published.Google Scholar
19 Vetterl, O., Finger, F., Carius, R., Hapke, P., Houben, L., Kluth, O., Lambertz, A., Mück, A., Rech, B. and Wagner, H., Sol. Energ Mat. and Sol. C. 62 (2000) 97108.Google Scholar
20 Mai, Y., Klein, S., Carius, R., Wolff, J., Lambertz, A., Finger, F. and Geng, X., J. Appl. Phys. 97 (2005) 114913.Google Scholar
21 Collins, R.W. and Ferlauto, A. S., Curr. Op. Sol. Stat. & Mat. Sci. 6 (2002) 425, and R.W. Collins, A.S. Ferlauto, G.M. Ferreira, Chi Chen, Joohyun Koh, R.J. Koval, Yeeheng Lee, J.M. Pearce, C.R. Wronski, Sol. Energ. Mat. Sol. Cell. 78 (2003) 143.Google Scholar
22 Yan, B., Yue, G., Yang, J., and Guha, S, Williamson, D. L., Han, D., Jiang, C., App. Phys. Lett. 85 (2004) 1955.Google Scholar
23 Veen, M. van, PhD thesis, Utrecht University, The Netherlands, 2003.Google Scholar