Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-04-30T19:19:25.683Z Has data issue: false hasContentIssue false
  • English
  • Français

Image Processing for Electron Microscope Investigations of Materials

Published online by Cambridge University Press:  21 February 2011

William Krakow
William Krakow*
Affiliation:
IBM T.J. Watson Research Center, P.O. Box 218 Yorktown Heights, N.Y. 10598, U.S.A.
Get access

Abstract

A time shared television digital image processing system has been developed for on-line electron microscopy and uses a large mainframe computer. The main component of the system is a digital television frame store which has many standard features for digital analysis such as: digitization, zoom and pan, arithmetic and Boolean processors, alphanumeric generators and so on. Images can be acquired at atomic resolution from a TEM, analyzed in real time and hard copy slides made under full computer control. A full range of computer software has been developed or modified from existing software and is generally compatible with IBM Fortran compilers. Some of the areas where extensive menu driven software has been developed are: particle size and feature analysis, algebraic and geometric image manipulations, Fourier analysis, digitization and process control, image contrast correction, text processing, etc. A number of applications areas have been explored which include: the structure of Si/SiO2 interfaces; nucleation of Au on rocksalt; the formation of hexatic structures from amorphous phases under shear, tension and compression; analysis of atomic surface structure and image motion and the analysis of field ion micrographs of amorphous structures. Several of these areas will be discussed in the context of image processing and materials characterization.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 39
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Herrmann, K.-H., Drahl, D., Rust, H.-P. and Ulrichs, O., Optik, 44, (1976) 393–412.Google Scholar
2. Smith, K.C.A., Inst. Phys. Conf. Ser. No. 61, Proc. EMAG Cong. Cambridge 1982 109–113.Google Scholar
2a also Proc. 10th Int. Cong. on Electron Microscopy Hamburg, West Germany 1982 123–130.Google Scholar
3. Yokota, Y., Tomita, M., Hashimoto, H. and Enoh, H., Ultramicrosc., 6, (1981) 313–322.CrossRefGoogle Scholar
4. Boyes, E.D., Muggridge, B.J., Goringe, M.J., Hutchinson, J.L. and Catlow, G., Inst. Phys. Conf. Ser. No. 61, Proc. EMAG. Conf. Cambridge 1982 119–122.Google Scholar
4a also Proc. 10th Int. Cong. on Electron Microscopy Hamburg, West Germany 1982 523–524.Google Scholar
5. Spence, J.C.H., Disko, M., Higgs, A., Wheatley, J. and Hashimoto, H., Proc. 10th Int. Cong. on Electron Microscopy Hamburg, West Germany 1982 519–520.Google Scholar
6. Thon, F., Z. Naturforsch., 21a (1966) 476.CrossRefGoogle Scholar
7. Tomita, M., Hashimoto, H., Ikuta, K., Yokota, Y. and Endoh, H., Proc. 10th Int. Cong. on Electron Microscopy Hamburg, West Germany 1982 521–522.Google Scholar
8. Erasmus, S.J. and Smith, K.C.A., Inst. Phys. Conf. Ser. No. 61, Proc. EMAG Conf. Cambridge 1982 115–119.Google Scholar
9. Erasmus, S.L., Smith, K.C.A. and Smith, D.J., Proc. 10th Int. Cong. on Electron Microscopy Hamburg, West Germany 1982 529–530.Google Scholar
10. Saxton, W.O. and Smith, D.J., Proc. 10th Int. Cong. on Electron Microscopy Hamburg, East Germany 1982 527–529.Google Scholar
11. Atkin, P., Erasmus, S.J. and Smith, K.C.A., Proc. 10th International Cong. on Electron Microscopy Hamburg, West Germany 1982 525–526.Google Scholar
12. Rink, M., J. of Microsc., 107 (1976) 267–286.CrossRefGoogle Scholar