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Field Emission from Tetrahedrally Bonded Amorphous Carbon

Published online by Cambridge University Press:  10 February 2011

W. I. Milne
Affiliation:
Engineering Department, Trumpington Street, Cambridge, CB2 1PZ, U.K.
J. Robertson
Affiliation:
Engineering Department, Trumpington Street, Cambridge, CB2 1PZ, U.K.
B. S. Satyanarayanan
Affiliation:
Engineering Department, Trumpington Street, Cambridge, CB2 1PZ, U.K.
A. Hart
Affiliation:
Engineering Department, Trumpington Street, Cambridge, CB2 1PZ, U.K.
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Abstract

A series of tetrahedrally bonded carbon (ta-C) films have been produced using a Filtered Cathodic Vacuum Arc System. The threshold field and current densities achievable have been investigated as a function of sp3/sp2 bonding ratio and nitrogen content. Typical undoped ta-C films have a threshold field of 15–20V/μm and optimally nitrogen doped films exhibit threshold fields as low as ∼ 5 V/μm. Current densities of typically 10-4 A/cm2 at an applied field of 20V/micron were also obtained.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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