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Effects of Composition and Strain on Image Contrast in Atomic-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

James M. Howe  and
Duane Sundo
James M. Howe
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
Duane Sundo
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
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Abstract

In this investigation, multislice image calculations were used to determine the effects of point defects on image contrast in ARTEM. It is shown that point defects with an atomic number different from the matrix produce a regular change in image contrast. The minimum detectable defect concentration for any system of matrix and solute can be predicted from a simple formula based on a rule of mixtures and the atomic numbers of the matrix and solute. The effects of lattice distortions associated with point defects appears to have minimal effect on image contrast in ARTEM. Optimum specimen and microscope conditions for observing point defects in crystals and the possibility of extending the analyses to interpret atomic-resolution images of larger defects are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 211
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Bourret, A., Desseaux, J. and Renault, A., Phil. Mag. A 45(1), 1 (1982).Google Scholar
2. Spence, J. C. H., O'Keefe, M. A. and lijima, S., Phil. Mag. A 38, 463 (1978).Google Scholar
3. Howe, J. M., Dahmen, U. and Gronsky, R., Phil. Mag. A 56(1), 31 (1987).CrossRefGoogle Scholar
4. Self, P. G., Glaisher, R. W. and Spargo, A. E. C., Ultramicroscopy 18, 49 (1985).Google Scholar
5. Ashby, M. F. and Brown, L. M., Phil. Mag. 8, 1649 (1963).Google Scholar
6. Reimer, L., Transmission Electron Microscopy: Physics of Image Formation and Mifcroanalysia(Springer-Verlag, Berlin 1984) p. 185.Google Scholar
7. Sir Hirsch, P., Howie, A., Nicholson, R. B., Pashley, D. W. and Whelan, M. J., Electron Microscopy of Thin Crystals (R. E. Krieger Pub. Co., Malabar, FL 1977) p. 317.Google Scholar
8. Tanaka, N. and Cowley, J. M., Acta Cryst. A 43, 337 (1987).Google Scholar
9. Bursill, L. A., Shen, G. J., Smith, D. J. and Blanchin, M. G., Ultramicroscopy,13 191 (1984).Google Scholar
10. Ourmazd, A., Rentschler, J. R. and Taylor, D. W., Phys. Rev. Lett. 57, 3073 (1986).Google Scholar
11. Coene, W., Bender, H. and Amelinckx, S., Phil. Mag. A, 52(3), 369 (1985).Google Scholar
12. Howie, A. and Basinski, Z. S., Phil. Mag. 149, 1039 (1969).Google Scholar
13. Dederichs, P. H., J. Phys. F: Metal Phys.,3 471 (1973).Google Scholar
14. O'Keefe, M. A. and Buseck, P. R., Trans. Amer. Cryst. Assoc. 15, 27 (1979).Google Scholar
15. Kilaas, R., in Proc. 45th Ann. Meeting E.M.S.A., edited by Bailey, G. W. (San Francisco Press, CA 1987) p. 66.Google Scholar
16. Howe, J. M., Basile, D. P., Prabhu, N. and Hatalis, M. K., Acta Cryst. A 44, 449 (1988).Google Scholar
17. Mott, N. F. and Nabarro, F. R. N., Proc. Phys. Soc. Lond. 52, 86 (1940).Google Scholar
18. Rose, J. and Gronsky, R., in Materials Problem Solving with the Transmission Electron Microscope, edited by Hobbs, L. W et al. (Mater. Res. Soc. Proc. 62, Pittsburgh, PA 1986) p. 57.Google Scholar
19. King, H. W., J. Mater. Sci. 1, 79 (1966).Google Scholar
20. Penisson, J. M., to be published in J. de Physique.Google Scholar
21. Ernst, F. and Haasen, P., phys. stat. sol. (a) 104. 403 (1987).CrossRefGoogle Scholar
22. Sato, T., Tanaka, N. and Takahashi, T., Trans. Japan Inst. Metals 29(1), 17 (1988).Google Scholar
23. lijima, S., Optik 48(2), 193 (1977).Google Scholar
24. Gibson, J. M., McDonald, M. L., Batstone, J. L. and Phillips, J. M., Ultramicroscopy 22, 35 (1987).CrossRefGoogle Scholar
25. Ourmazd, A., Rentschler, J. R. and Taylor, D. W., Phys. Rev. Lett. 57, 3073 (1986).Google Scholar