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Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide

Published online by Cambridge University Press:  31 January 2011

Raffaella Lo Nigro
Affiliation:
raffaella.lonigro@imm.cnr.it, IMM-CNR, catania, Italy
Patrick Fiorenza
Affiliation:
patrick.fiorenza@imm.cnr.it, IMM-CNR, catania, Italy
Vito Raineri
Affiliation:
vito.raineri@imm.cnr.it, IMM-CNR, catania, Italy
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Abstract

Electrical characterization of CaCu3Ti4O12 (CCTO) ceramics with scanning probe based techniques has been carried out. In particular, conductive atomic force microscopy (C-AFM) and scanning impedance microscopy (SIM) have been used to demonstrate the presence, shape and size in CCTO ceramics of the different electrically domains, both at the grain boundaries and within the grains. The electrical characteristics of single grains and of single domains have been evaluated and it has been observed that the conductive grains are surrounded by insulating grain boundaries.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide
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Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide
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Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide
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