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Barrier Height Difference Induced by Surface Terminations for Field Emission from P-doped Diamond

Published online by Cambridge University Press:  01 February 2011

Yuki Kudo
Affiliation:
g086049@yamata.icu.ac.jp, International Christian University, Department of physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan, +81 422-33-3254, +81 422-33-3254
Takatoshi Yamada
Affiliation:
takatoshi-yamada@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Hisato Yamaguchi
Affiliation:
yhisato@nt.icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Tomoaki Masuzawa
Affiliation:
g086052@yamata.icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Ichitaro Saito
Affiliation:
is265@eng.cam.ac.uk, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Shin-ichi Shikata
Affiliation:
s-shikata@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Christoph E. Nebel
Affiliation:
christoph.nebel@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Ken Okano
Affiliation:
kenokano@icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
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Abstract

In this paper, we measured the field emission properties of reconstructed P-doped diamond under various anode-diamond distances and compared with the oxidized surface. Voltage drops in the vacuum was estimated to be 4.95 and 26.6 V/μm for the reconstructed and the oxidized, respectively. Moreover, we calculated the barrier height ratio between each surface. Our data indicates the changes in electron affinity strongly affect on the field emission properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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