Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-24T01:11:46.357Z Has data issue: false hasContentIssue false

Barrier Height Difference Induced by Surface Terminations for Field Emission from P-doped Diamond

Published online by Cambridge University Press:  01 February 2011

Yuki Kudo
Affiliation:
g086049@yamata.icu.ac.jp, International Christian University, Department of physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan, +81 422-33-3254, +81 422-33-3254
Takatoshi Yamada
Affiliation:
takatoshi-yamada@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Hisato Yamaguchi
Affiliation:
yhisato@nt.icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Tomoaki Masuzawa
Affiliation:
g086052@yamata.icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Ichitaro Saito
Affiliation:
is265@eng.cam.ac.uk, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Shin-ichi Shikata
Affiliation:
s-shikata@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Christoph E. Nebel
Affiliation:
christoph.nebel@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Diamond Research Center, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan
Ken Okano
Affiliation:
kenokano@icu.ac.jp, International Christian University (ICU), Department of Physics, 3-10-2 Osawa, Mitaka, Tokyo, 185-8585, Japan
Get access

Abstract

In this paper, we measured the field emission properties of reconstructed P-doped diamond under various anode-diamond distances and compared with the oxidized surface. Voltage drops in the vacuum was estimated to be 4.95 and 26.6 V/μm for the reconstructed and the oxidized, respectively. Moreover, we calculated the barrier height ratio between each surface. Our data indicates the changes in electron affinity strongly affect on the field emission properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Vacuum Micro-electronics, edited by Zhu, W. (Wiley, New York, 2001).Google Scholar
2. Bandis, C. and Pate, B. B., Appl. Phys. Lett. 69, 366 (1996).Google Scholar
3. Yamada, T., Sawabe, A., Koizumi, S., Itoh, J., and Okano, K., Appl. Phys. Lett. 76, 1297 (2000).Google Scholar
4. Koizumi, S., Kamo, M., Sato, Y., Ozaki, H. and Inuzuka, T., Appl. Phys. Lett. 71, 1065 (1997).Google Scholar
5. Koizumi, S., Watanabe, K, Hasegawa, Masataka, and Kanda, Hisao, Science, 292, 1899 (2001).Google Scholar
6. Takeuchi, D., Kamo, H., Ri, G. S., Yamada, T., Vinod, P. R., Nebel, C. E., Okushi, H., and Yamasaki, S., Appl. Phys. Lett. 86, 152103 (2005).10.1063/1.1900925Google Scholar
7. Okano, K., and Gleason, K. K., Electron Lett, 31, 74 (1995).Google Scholar
8. Sugino, T., Kuriyama, K., Kimura, C., Yokoa, Y., Kawasaki, S., and Shirafuji, J., J. Appl. Phys. 86, 4635 (1999).Google Scholar
9. Yamada, T., Kato, H., Shikata, S., Nebel, C. E., Yamaguchi, H., Kudo, Y., and Okano, K., J. Vac. Sci. Technol. B 24(2) (2006).10.1116/1.2180263Google Scholar
10. Yamada, T., Okano, K., Yamaguchi, H., Kato, H., Shikata, S., and Nebel, C. E., Appl. Phys. Lett. 88, 212114 (2006).10.1063/1.2206552Google Scholar
11. Yamada, T., Nebel, C. E., Somu, K., Uetsuka, H., Yamaguchi, H., Yuki, Y., Okano, K., and Shikata, S., phys. stat. sold. (a) 204, 2957 (2007).Google Scholar
12. Okano, K., Yamada, T., Sawabe, A., Koizumi, S., Itoh, J., and Amaratunga, G. A., Appl. Phys. Lett. 79, 275 (2005).10.1063/1.1385341Google Scholar
13. Yamada, T., Kato, H., Takeuchi, D., Shikata, S., Yamaguchi, H., Okano, K., and Nebel, C. E., Diamond Relat. Mater. 15, 863 (2006)10.1016/j.diamond.2005.12.014Google Scholar
14. Dyke, P. and Dolan, W. W., Field Emission, Advances in Electronics and Electron Physics 8, Academic press, New York, 1956.Google Scholar