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Atom Probe and Hrem Characterization of Transition Metal Multilayers.

Published online by Cambridge University Press:  21 February 2011

A. Cerezo ,
M.G. Hetherington  and
A.J.K. Petford-Long
A. Cerezo
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
M.G. Hetherington
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
A.J.K. Petford-Long
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
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Abstract

The direct measurement of the composition variations in transition metal multilayers has been carried out using the atom-probe and the position sensitive atom-probe (POSAP). The atom-probe and POSAP do not have sufficient resolution to determine the crystal structure and this complementary information has been obtained using high resolution electron microscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 333
Copyright
Copyright © Materials Research Society 1990

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References

1. Cerezo, A., Godfrey, T. J., Grovenor, C. R. M., Hetherington, M. G., Hoyle, R. M., Jakubovics, J. P., Liddle, J. A., Smith, G. D. W., and Worrall, G. M., J.Microscopy, 154, 215 (1989).Google Scholar
2. Cerezo, A. and Hetherington, M. G., J. de Phys., 50–C8 523, (1989).Google Scholar
3. Liddle, A., Cerezo, A., Grovenor, C. R. M., J. de Phys. 50–C8, 437 (1989).Google Scholar